The mass spectrometry (MS) of stable species and determination of the rates of chemical reactions occurring in gas phase and on treated surfaces are discussed. The presented approach deals with basic equations of chemical kinetics, gas flow analysis and calibration of the mass spectrometer. To verify thia approach, experimental data obtained during etching of amorphous silicon in NF3 plasma have been evaluated.

Mass spectrometric determination of reaction rates during plasma processing of layers

G Cicala;
1995

Abstract

The mass spectrometry (MS) of stable species and determination of the rates of chemical reactions occurring in gas phase and on treated surfaces are discussed. The presented approach deals with basic equations of chemical kinetics, gas flow analysis and calibration of the mass spectrometer. To verify thia approach, experimental data obtained during etching of amorphous silicon in NF3 plasma have been evaluated.
1995
Istituto di Nanotecnologia - NANOTEC
Inglese
12th International Symposium on Plasma Chemistry, (ISPC-12) Proceedings IUPAC
12th International Symposium on Plasma Chemistry, (ISPC-12)
IV
1849
1854
6
1-887976-04-3
IUPAC, International union of pure and applied chemistry
Research Triangle Park, NC
STATI UNITI D'AMERICA
Sì, ma tipo non specificato
21-25 August 1995
Minneapolis (Minnesota USA)
6
none
Trnovec, J; Martisovits, V; Cicala, G; Capezzuto, P; Bruno, G; Jurani, R
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/127466
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