A systematic study of the conditions needed to grow films of La doped BaTi03 by pulsed laser deposition is described. X ray diffraction , scanning electron microscopy and resistivity measurements have been used to characterise the films and correlate the surface and bulk properties with the deposition temperature, 02 partial pressure and laser fluence.

LANTHANUM DOPED BARIUM 'iiTANATE: A COMPARISON OF BULK AND THIN FILM MATERIAL

E Melioli;M Leoni;M Viviani
1996

Abstract

A systematic study of the conditions needed to grow films of La doped BaTi03 by pulsed laser deposition is described. X ray diffraction , scanning electron microscopy and resistivity measurements have been used to characterise the films and correlate the surface and bulk properties with the deposition temperature, 02 partial pressure and laser fluence.
1996
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Inglese
J.L.; Labrincha, J.A.; Vilarinho, P.M. Baptista
Electroceramics V: International Conference on Electronic Ceramics & Applications
International Conference on Electronic Ceramics & Applications - Electroceramics V
367
370
9728283172
September 2 - 4, 1996
Aveiro Portugal
7
restricted
Vasco, E; L, BE Watts; Leccabue, F; Melioli, E; Leoni, M; Nanni, P; Viviani, M
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/127691
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