We show the defect dependence of the internal field in Lithium Niobate using a full-field interferometric method and demonstrate that it can be directly measured on some clusters of defects embedded in a stoichiometric matrix. Results show that the value of the internal field grows in proximity of defects and vanishes far from them, which addresses the long-standing issue about its origin in Lithium Niobate crystal.

On the origin of internal field in Lithium Niobate crystals directly observed by digital holography

Paturzo Melania;Ferraro Pietro;Grilli Simonetta;De Nicola Sergio;Pierattini Giovanni;
2005

Abstract

We show the defect dependence of the internal field in Lithium Niobate using a full-field interferometric method and demonstrate that it can be directly measured on some clusters of defects embedded in a stoichiometric matrix. Results show that the value of the internal field grows in proximity of defects and vanishes far from them, which addresses the long-standing issue about its origin in Lithium Niobate crystal.
2005
Istituto di Scienze Applicate e Sistemi Intelligenti "Eduardo Caianiello" - ISASI
Istituto Nazionale di Ottica - INO
13
5416
5423
Sì, ma tipo non specificato
Lithium Niobate; Electro-optical materials; Holographic Interferometry; Image reconstruction techniques
9
info:eu-repo/semantics/article
262
Paturzo, Melania; Ferraro, Pietro; Grilli, Simonetta; Alfieri, Domenico; De Natale Paolo de Angelis Marella Finizio, Andrea; DE NICOLA, Sergio; Pierat...espandi
01 Contributo su Rivista::01.01 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/150129
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