We describe a method for the direct epitaxial growth of a single photon emitter, based on GaAs quantum dots fabricated by droplet epitaxy, working at liquid nitrogen temperature on Si substrates. The achievement of quantum photon statistics up to T=80 K is directly provided by antibunching in the second order correlation function as measured with a Hanbury Brown and Twiss interferometer.

High Quality GaAs single photon emitters on Si substrate

C FRIGERI;
2013

Abstract

We describe a method for the direct epitaxial growth of a single photon emitter, based on GaAs quantum dots fabricated by droplet epitaxy, working at liquid nitrogen temperature on Si substrates. The achievement of quantum photon statistics up to T=80 K is directly provided by antibunching in the second order correlation function as measured with a Hanbury Brown and Twiss interferometer.
2013
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Inglese
Thomas Ihn, Clemens Rössler and Aleksey Kozikov
The Physics of Semiconductors: Proceedings of the 31st International Conference on the Physics of Semiconductors (ICPS) 2012
31st International Conference on the Physics of Semiconductors (ICPS) 2012
1566
433
434
978-0-7354-1194-4
http://scitation.aip.org/content/aip/proceeding/aipcp/10.1063/1.4848471
AIP, American institute of physics
Melville, NY
STATI UNITI D'AMERICA
Sì, ma tipo non specificato
29 July - 03 August 2012
Zurich (CH)
Single photon
emitter
GaAs/Si
10
none
Bietti, S; Cavigli, L; Accanto, N; Minari, S; Abbarchi, M; Isella, G; Frigeri, C; Vinattieri, A; Gurioli, M; Sanguinetti, S
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/250666
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