Effects of finite capacitance on the Current-Voltage (I-V) characteristics of a Josephson tunnel junction in presence of both thermal and quantum noise have been investigated. The analysis allows the determination of significant features of the I-V curves in different situations.
EFFECTS OF FLUCTUATIONS ON CURRENT-VOLTAGE CHARACTERISTICS OF JOSEPHSON TUNNEL JUNCTIONS.
Camerlingo C;Cristiano Roberto;
1984
Abstract
Effects of finite capacitance on the Current-Voltage (I-V) characteristics of a Josephson tunnel junction in presence of both thermal and quantum noise have been investigated. The analysis allows the determination of significant features of the I-V curves in different situations.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
