VALERINI, DANIELE
VALERINI, DANIELE
Istituto per la Microelettronica e Microsistemi - IMM - Sede Secondaria Lecce
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Role of oxygen contaminant on the physical properties of sputtered AlN thin films
2015 Signore, M A; Taurino, A; Valerini, D; Rizzo, A; Farella, I; Catalano, M; Quaranta, F; Siciliano, P
Study of temperature dependence and angular distribution of poly(9,9-dioctylfluorene) polymer films deposited by matrix-assisted pulsed laser evaporation (MAPLE)
2009 Caricato AP; Anni M; Manera MG; Martino M; Rella R; Romano F; Tunno T; Valerini D
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Role of oxygen contaminant on the physical properties of sputtered AlN thin films | 1-gen-2015 | Signore, M A; Taurino, A; Valerini, D; Rizzo, A; Farella, I; Catalano, M; Quaranta, F; Siciliano, P | |
| Study of temperature dependence and angular distribution of poly(9,9-dioctylfluorene) polymer films deposited by matrix-assisted pulsed laser evaporation (MAPLE) | 1-gen-2009 | Caricato AP; Anni M; Manera MG; Martino M; Rella R; Romano F; Tunno T; Valerini D |