Filicori, Fabio
Filicori, Fabio
Istituto di Elettronica e di Ingegneria dell'Informazione e delle Telecomunicazioni - IEIIT
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A double-pulse technique for the dynamic I/V characterization of GaN FETs
2014 Santarelli, A; Cignani, R; Gibiino, Gp; Niessen, D; Traverso, Pa; Florian, C; Schreurs, Dmmp; Filicori, F
GaN FET nonlinear modeling based on double pulse I/V characteristics
2014 Santarelli, A; Niessen, D; Cignani, R; Gibiino, Gp; Traverso, Pa; Florian, C; Schreurs, Dmmp; Filicori, F
An active bias network for the characterization of low-frequency dispersion in high-power microwave electron devices
2013 Florian C.; Traverso P.A.; Santarelli A.; Filicori F.
Characterization of the nonlinear thermal resistance and pulsed thermal dynamic behavior of AlGaN-GaN HEMTs on SiC
2013 Florian C.; Santarelli A.; Cignani R.; Filicori F.
New pulsed measurement setup for GaN and GaAs FETs characterization
2012 Santarelli, A; Cignani, R; Niessen, D; Traverso, Pa; Filicori, F
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A double-pulse technique for the dynamic I/V characterization of GaN FETs | 1-gen-2014 | Santarelli, A; Cignani, R; Gibiino, Gp; Niessen, D; Traverso, Pa; Florian, C; Schreurs, Dmmp; Filicori, F | |
| GaN FET nonlinear modeling based on double pulse I/V characteristics | 1-gen-2014 | Santarelli, A; Niessen, D; Cignani, R; Gibiino, Gp; Traverso, Pa; Florian, C; Schreurs, Dmmp; Filicori, F | |
| An active bias network for the characterization of low-frequency dispersion in high-power microwave electron devices | 1-gen-2013 | Florian C.; Traverso P.A.; Santarelli A.; Filicori F. | |
| Characterization of the nonlinear thermal resistance and pulsed thermal dynamic behavior of AlGaN-GaN HEMTs on SiC | 1-gen-2013 | Florian C.; Santarelli A.; Cignani R.; Filicori F. | |
| New pulsed measurement setup for GaN and GaAs FETs characterization | 1-gen-2012 | Santarelli, A; Cignani, R; Niessen, D; Traverso, Pa; Filicori, F |