GOVONI, DONATO
GOVONI, DONATO
Istituto per le Macchine Agricole e Movimento Terra - IMAMOTER - Sede Ferrara (attivo dal 18/11/1923 al 31/12/2021)
BAUMA 2007
2007 Paoluzzi, R; Rigamonti, G; Govoni, D; Bonanno, A; Marani, P; Cantelli, S; Cristofori, G
A study of He+ ion-induced damage in silicon by quantitative analysis of charge collection efficiency data
1998 Nipoti, R; Donolato, C; Govoni, D; Rossi, P; Egeni, ; Gp, ; Rudello, ; V,
On the resolution of semiconductor multilayers with a scanning electron microscope
1995 Merli, Pg; Migliori, A; Nacucchi, M; Govoni, D; Mattei, G
Resolution of semiconductor multilayers using backscattered electrons in scanning electron microscopy
1995 Govoni, Donato; Merli, PIER GIORGIO; Migliori, Andrea; Nacucchi, Michele
Structural and analytical characterization of Si1-x Gex /Si heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double crystal X-ray diffractometry
1992 Aldo Armigliato; Marco Servidori; Franco Cembali; Rita Fabbri; Rodolfo Rosa; Franco Corticelli; Donato Govoni; Antonio V. Drigo; Massimo Mazzer; Filippo Romanato; Stefano Frabboni; Roberto Balboni; Subramanian S. Iyer et Antonella Guerrieri
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| BAUMA 2007 | 1-gen-2007 | Paoluzzi, R; Rigamonti, G; Govoni, D; Bonanno, A; Marani, P; Cantelli, S; Cristofori, G | |
| A study of He+ ion-induced damage in silicon by quantitative analysis of charge collection efficiency data | 1-gen-1998 | Nipoti, R; Donolato, C; Govoni, D; Rossi, P; Egeni, ; Gp, ; Rudello, ; V, | |
| On the resolution of semiconductor multilayers with a scanning electron microscope | 1-gen-1995 | Merli, Pg; Migliori, A; Nacucchi, M; Govoni, D; Mattei, G | |
| Resolution of semiconductor multilayers using backscattered electrons in scanning electron microscopy | 1-gen-1995 | Govoni, Donato; Merli, PIER GIORGIO; Migliori, Andrea; Nacucchi, Michele | |
| Structural and analytical characterization of Si1-x Gex /Si heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double crystal X-ray diffractometry | 1-gen-1992 | Aldo Armigliato; Marco Servidori; Franco Cembali; Rita Fabbri; Rodolfo Rosa; Franco Corticelli; Donato Govoni; Antonio V. Drigo; Massimo Mazzer; Filippo Romanato; Stefano Frabboni; Roberto Balboni; Subramanian S. Iyer et Antonella Guerrieri |