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ROSA, RODOLFO

ROSA, RODOLFO  

Istituto per la Microelettronica e Microsistemi - IMM  

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Titolo Data di pubblicazione Autore(i) File
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films 1-gen-2018 Parisini A.; Frabboni S.; Gazzadi G.C.; Rosa R.; Armigliato A.
Genome characterization through dichotomic classes: an analysis of the whole chromosome 1 of a. thaliana 1-gen-2013 Properzi, E; Giannerini, S; Gonzalez Diego, L; Rosa, R
Circular codes revisited: a statistical approach 1-gen-2011 Gonzalez Diego, L; Giannerini, S; Rosa, R
The mathematical structure of the genetic code: a tool for inquiring on the origin of life 1-gen-2009 Gonzalez Diego Luis; Giannerini Simone; Rosa Rodolfo
Strong short-range correlations and dichotomic codon classes in coding DNA sequences 1-gen-2008 Gonzalez Diego Luis; Giannerini Simone; Rosa Rodolfo
Testing chaotic dynamics in systems with two positive Lyapunov exponents: A bootstrap solution 1-gen-2007 Simone, Giannerini; Rosa, Rodolfo; Gonzalez, DIEGO LUIS
Detecting structure in parity binary sequences: error correction and detection in DNA 1-gen-2006 Gonzalez Diego Luis; Giannerini Simone; Rosa Rodolfo
Structural and analytical characterization of Si1-x Gex /Si heterostructures by Rutherford backscattering spectrometry and channeling, analytical electron microscopy and double crystal X-ray diffractometry 1-gen-1992 Aldo Armigliato; Marco Servidori; Franco Cembali; Rita Fabbri; Rodolfo Rosa; Franco Corticelli; Donato Govoni; Antonio V. Drigo; Massimo Mazzer; Filippo Romanato; Stefano Frabboni; Roberto Balboni; Subramanian S. Iyer et Antonella Guerrieri
Monte Carlo Simulation of Elastic and Inelastic Scattering of Electrons in Thin Films:1. Valence Electron losses 1-gen-1984 A. Desalvo; A. Parisini;R. Rosa