CHRISTOPHER, HARDLY JOSEPH
CHRISTOPHER, HARDLY JOSEPH
Istituto per la Microelettronica e Microsistemi - IMM
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Microwave Characterization of Magnetic Materials Using Scanning Microwave Microscopy Technique
2016 Christopher, HARDLY JOSEPH; Badino, Giorgio; Tuca, Silviu-Sorin; Sardi, Giovanni Maria; Kienberger, Ferry; Marcelli, Romolo
Scanning Microwave Microscopy for Nanoscale Characterization of Semiconductors: De-embedding reflection contact mode measurements
2015 Michalas L; Lucibello A; Badino G; Joseph CH; Brinciotti E; Kienberger F; Proietti E; Marcelli R
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Microwave Characterization of Magnetic Materials Using Scanning Microwave Microscopy Technique | 1-gen-2016 | Christopher, HARDLY JOSEPH; Badino, Giorgio; Tuca, Silviu-Sorin; Sardi, Giovanni Maria; Kienberger, Ferry; Marcelli, Romolo | |
Scanning Microwave Microscopy for Nanoscale Characterization of Semiconductors: De-embedding reflection contact mode measurements | 1-gen-2015 | Michalas L; Lucibello A; Badino G; Joseph CH; Brinciotti E; Kienberger F; Proietti E; Marcelli R |