In this work, microwave characterization of the magnetic materials using Scanning Microwave Microscopy (SMM) technique is presented. The reflection coefficient S11 changes with the external magnetic fields are analyzed and magnetic domains are imaged in both amplitude and phase of the reflected microwave signa

Microwave Characterization of Magnetic Materials Using Scanning Microwave Microscopy Technique

Joseph, Hardly Christopher;Sardi, Giovanni Maria;Marcelli, Romolo
2016

Abstract

In this work, microwave characterization of the magnetic materials using Scanning Microwave Microscopy (SMM) technique is presented. The reflection coefficient S11 changes with the external magnetic fields are analyzed and magnetic domains are imaged in both amplitude and phase of the reflected microwave signa
2016
Istituto per la Microelettronica e Microsistemi - IMM
Scanning Microwave Microscopy (SMM), Magnetic domain, Hysteresis, Magnetic materials
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/493965
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