MICHALAS, LOUKAS
MICHALAS, LOUKAS
Istituto per la Microelettronica e Microsistemi - IMM
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Near-field microwave techniques for micro- and nano-scale characterization in materials science
2017 Marcelli, R.; Lucibello, A.; Capoccia, G.; Proietti, E.; Sardi, G. M.; Joseph, C. H.; Michalas, L.; Bartolucci, G.; Kienberger, F.; Gramse, G.
Nanoscale characterization of MOS systems by microwaves: Dopant profiling calibration
2015 Michalas L.; Lucibello A.; Joseph C.H.; Brinciotti E.; Kienberger F.; Proietti E.; Marcelli R.
Scanning Microwave Microscopy for Nanoscale Characterization of Semiconductors: De-embedding reflection contact mode measurements
2015 Michalas L; Lucibello A; Badino G; Joseph CH; Brinciotti E; Kienberger F; Proietti E; Marcelli R
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Near-field microwave techniques for micro- and nano-scale characterization in materials science | 1-gen-2017 | Marcelli, R.; Lucibello, A.; Capoccia, G.; Proietti, E.; Sardi, G. M.; Joseph, C. H.; Michalas, L.; Bartolucci, G.; Kienberger, F.; Gramse, G. | |
| Nanoscale characterization of MOS systems by microwaves: Dopant profiling calibration | 1-gen-2015 | Michalas L.; Lucibello A.; Joseph C.H.; Brinciotti E.; Kienberger F.; Proietti E.; Marcelli R. | |
| Scanning Microwave Microscopy for Nanoscale Characterization of Semiconductors: De-embedding reflection contact mode measurements | 1-gen-2015 | Michalas L; Lucibello A; Badino G; Joseph CH; Brinciotti E; Kienberger F; Proietti E; Marcelli R |