POZZI, GIULIO

POZZI, GIULIO  

Istituto per la Microelettronica e Microsistemi - IMM  

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Risultati 1 - 7 di 7 (tempo di esecuzione: 0.013 secondi).
Titolo Data di pubblicazione Autore(i) File
Symmetry and planar chirality measured with a log-polar transformation in a transmission electron microscope 1-gen-2024 Tavabi, A. H.; Rosi, P.; Ravelli, R. B. G.; Gijsbers, A.; Rotunno, E.; Guner, T.; Zhang, Y.; Roncaglia, A.; Belsito, L.; Pozzi, G.; Denneulin, T.; Gazzadi, G. C.; Ghosh, M.; Nijland, R.; Frabboni, S.; Peters, P. J.; Karimi, E.; Tiemeijer, P.; Dunin-Borkowski, R. E.; Grillo, V.
Experimental Demonstration of an Electrostatic Orbital Angular Momentum Sorter for Electron Beams 1-gen-2021 Tavabi, A. H.; Rosi, P.; Rotunno, E.; Roncaglia, A.; Belsito, L.; Frabboni, S.; Pozzi, G.; Gazzadi, G.; Lu, P. -H.; Nijland, R.; Ghosh, M.; Tiemeijer, P.; Karimi, E.; Dunin-Borkowski, R. E.; Grillo, V.
Generation of electron vortices using nonexact electric fields 1-gen-2020 Tavabi, Amir H.; Larocque, Hugo; Lu, Peng-Han; Duchamp, Martial; Grillo, Vincenzo; Karimi, Ebrahim; Dunin-Borkowski, Rafal E.; Pozzi, Giulio
Electron Holography of Size- controlled Nanoclusters 1-gen-2006 Canton, P; Fazzini, Pf; Pozzi, G; Merli, Pg
Electron Holography of Size- controlled Nanoclusters 1-gen-2006 Canton, P; Fazzini, Pf; Pozzi, G; Merli, Pg
Interference Electron Microscopy of reverse biased p-n junction 1-gen-2005 Fazzini, Pf; Merli, Pg; Pozzi, G; Ubaldi, F
Interference Electron Microscopy of reverse biased p-n junction 1-gen-2005 Fazzini, Pf; Merli, Pg; Pozzi, G; Ubaldi, F