RIZZOLI, RITA
RIZZOLI, RITA
Istituto per la Microelettronica e Microsistemi - IMM
A first test of CUPID prototypal light detectors with NTD-Ge sensors in a pulse-tube cryostat
2023 Alfonso K.; Armatol A.; Augier C.; Avignone III C.; Azzolini O.; Balata M.; Barabash A.S.; Bari G.; Barresi A.; Baudin D.; Bellini F.; Benato G.; Berest V.; Beretta M.; Bettelli M.; Biassoni M.; Billard J.; Boldrini V.; Branca A.; Brofferio C.; Bucci C.; Camilleri J.; Campani A.; Capelli C.; Capelli S.; Cappelli L.; Cardani L.; Carniti P.; Casali N.; Celi E.; Chang C.; Chiesa D.; Clemenza M.; Colantoni I.; Copello S.; Craft E.; Cremonesi O.; Creswick R.J.; Cruciani A.; D'Addabbo A.; D'Imperio G.; Dabagov S.; Dafinei I.; Danevich F.A.; De Jesus M.; de Marcillac P.; Dell'Oro S.; Di Domizio S.; Di Lorenzo S.; Dixon T.; Dompé V.; Drobizhev A.; Dumoulin L.; Fantini G.; Faverzani M.; Ferri E.; Ferri F.; Ferroni F.; FigueroaFeliciano E.; Foggetta L.; Formaggio J.; Franceschi A.; Fu C.; Fu S.; Fujikawa B.K.; Gallas A.; Gascon J.; Ghislandi S.; Giachero A.; Gianvecchio A.; Girola M.; Gironi L.; Giuliani A.; Gorla P.; Gotti C.; Grant C.; Gras P.; Guillaumon P.V.; Gutierrez T.D.; Han K.; Hansen E.V.; Heeger K.M.; Helis D.L.; Huang H.Z.; Imbert L.; Johnston J.; Juillard A.; Karapetrov G.; Keppel G.; Khalife H.; Kobychev V.V.; Kolomensky Yu.G.; Konovalov S.I.; Kowalski R.; Langford T.; Lefevre M.; Liu R.; Liu Y.; Loaiza P.; Ma L.; Madhukuttan M.; Mancarella F.; Marini L.; Marnieros S.; Martinez M.; Maruyama R.H.; Mas Ph.; Mayer D.; Mazzitelli G.; Mei Y.; Milana S.; Morganti S.; Napolitano T.; Nastasi M.; Nikkel J.; Nisi S.; Nones C.; Norman E.B.; Novosad V.; Nutini I.; O'Donnell T.; Olivieri E.; Olmi M.; Ouellet J.L.; Pagan S.; Pagliarone C.; Pagnanini L.; Pattavina L.; Pavan M.; Peng H.; Pessina G.; Pettinacci V.; Pira C.; Pirro S.; Poda D.V.; Polischuk O.G.; Ponce I.; Pozzi S.; Previtali E.; Puiu A.; Quitadamo S.; Ressa A.; Rizzoli R.; Rosenfeld C.; Rosier P.; Scarpaci J.A.; Schmidt B.; Sharma V.; Shlegel V.N.; Singh V.; Sisti M.; Slocum P.; Speller D.; Surukuchi P.T.; Taffarello L.; Tomei C.; Torres J.A.; Tretyak V.I.; Tsymbaliuk A.; Velazquez M.; Vetter K.J.; Wagaarachchi S.L.;, Wang G.; Wang L.; Wang R.; Welliver B.; Wilson J.; Wilson K.; Winslow L.A.; Xue M.; Yan L.; Yang J.; Yefremenko V.; Umatov V.I.; Zarytskyy M.M.; Zhang J.; Zolotarova A.; Zucchelli S.
A novel position detector based on nanotechnologies: the NanoChanT project
2006 Angelucci R; Corticelli F; Cuffiani M; Dallavalle GM; Malferrari L; Montanari A; Odorici F; Rizzoli R; Veronese GP
A ternary-3D analysis of the optical properties of amorphous hydrogenated silicon-rich carbide
2018 Summonte, C; Gaspari, F; Quaranta, S; Rizzoli, R; Centurioni, E; Canino, M; Polliotti, Ay; Bianconi, M; Desalvo, A
a-Si : H based two-dimensional photonic crystals
2003 Bennici, E; Ferrero, S; Giorgis, F; Pirri, Cf; Rizzoli, R; Schina, P; Businaro, L; Di Fabrizio, E
a-SiN : H multilayer versus bulk structure: a real improvement of radiative efficiency?
2000 Rizzoli R;Summonte C;Rava P;Barucca G;Desalvo A;Giorgis; F
Amorphous carbon deposited by pulsed laser ablation as material for cold cathode flat emitters
2002 Angelucci, R; Rizzoli, R; Salvatori, S; Nicoletti, S; Migliori, A; Brugnoli, E
Amorphous silicon carbide/crystalline silicon heterojunction solar cells: A comprehensive study of the photocarrier collection
1998 van Cleef; MWM;Rubinelli; FA;Rizzoli R;Pinghini R;Schropp; REI;van der Weg; WF
Amorphous silicon nitrogen alloys deposited by PECVD under hydrogen dilution conditions
1998 Rava, P; Giuliani, F; Giorgis, F; Pirri, Cf; Tresso, E; Mandracci, P; Summonte, C; Rizzoli, R; Desalvo, A
Amorphous silicon nitrogen alloys deposited by PECVD under hydrogen dilution conditions
1998 Rava, P; Giuliani, F; Giorgis, F; Pirri, Cf; Tresso, E; Mandracci, P; Summonte, C; Rizzoli, R; Desalvo, A
An Investigation on suprathermal electrons formation in a B-min ECR machine and a novel method for their damping
2013 D Mascali; L Celona; S Gammino; G Castro; R Miracoli; F P Romano; L Malferrari; F Odorici; R Rizzoli; G P Veronese;T Serafino
An optimized texturing process for silicon solar cell substrates using TMAH
2005 Iencinella D.; Centurioni E.; Rizzoli R.; Zignani F.
Anatomy of mu c-Si thin films by plasma enhanced chemical vapor deposition: An investigation by spectroscopic ellipsometry
2000 Losurdo, M; Rizzoli, R; Summonte, C; Cicala, G; Capezzuto, P; Bruno, Giovanni; G,
Annealing Behaviour of High Concentration of Implanted Sb and Sn in Silicon
1986 G.Weyer; A.Nylandsted Larsen; F.T.Pedersen; R.Galloni; R. Rizzoli
ANOMALOUS DISTRIBUTION OF AS DURING IMPLANTATION IN SILICON UNDER SELF-ANNEALING CONDITIONS
1989 Lulli, G; Merli, ; Pg, ; Rizzoli, R; Berti, M; Drigo, ; Av,
Application of nanotechnologies in high energy physics
2003 Angelucci, R.; Corticelli, F.; Cuffiani, M.; Dallavalle, G. M.; Malferrari, L.; Montanari, A.; Montanari, C.; Odorici, F.; Rizzoli, R.; Summonte, C.
Application of nanotechnologies in high energy physics
2003 Angelucci, R; Corticelli, F; Cuffiani, M; Dallavalle, Gm; Malferrari, L; Montanari, A; Montanari, C; Odorici, F; Rizzoli, R; Summonte, C
BORON AND PHOSPHORUS DOPING OF A-SIC-H THIN-FILMS BY MEANS OF ION-IMPLANTATION
1995 DEMICHELIS F;CROVINI G;PIRRI; CF;TRESSO E;GALLONI R;SUMMONTE C;RIZZOLI R;ZIGNANI F;RAVA; P
BORON AND PHOSPHORUS ION IMPLANTATION IN A-SIXC1-XH THIN FILMS
1994 Rizzoli, R; Galloni, R; Summonte, C; Demichelis, F; Pirri, ; Cf, ; Tresso, E; Crovini, G; Rava, P; Zignani, ; F,
Brightness Degradation Controlled by Current Induced Metastable Defect Creation in a-SiC:H Based Light Emitting Diodes
1995 Rizzoli, R; Summonte, C; Galloni, R; Ruth, M; Desalvo, A; Zignan, F; Rava, P; Demichelis, F; F Pirria, C; Tresso, E; Crovini, G; Giorgis, F; Madan, A
Carbon Nanotubes Array as a Charge Collector of a High Resolution Radiation Sensor
2003 R. Angelucci; R. Rizzoli; F. Corticelli; W. de Paepe; G.M. Dallavalle; L. Malferrari; A. Montanari; C. Montanari; F. Odorici; M. Cuffiani
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A first test of CUPID prototypal light detectors with NTD-Ge sensors in a pulse-tube cryostat | 1-gen-2023 | Alfonso K.; Armatol A.; Augier C.; Avignone III C.; Azzolini O.; Balata M.; Barabash A.S.; Bari G.; Barresi A.; Baudin D.; Bellini F.; Benato G.; Berest V.; Beretta M.; Bettelli M.; Biassoni M.; Billard J.; Boldrini V.; Branca A.; Brofferio C.; Bucci C.; Camilleri J.; Campani A.; Capelli C.; Capelli S.; Cappelli L.; Cardani L.; Carniti P.; Casali N.; Celi E.; Chang C.; Chiesa D.; Clemenza M.; Colantoni I.; Copello S.; Craft E.; Cremonesi O.; Creswick R.J.; Cruciani A.; D'Addabbo A.; D'Imperio G.; Dabagov S.; Dafinei I.; Danevich F.A.; De Jesus M.; de Marcillac P.; Dell'Oro S.; Di Domizio S.; Di Lorenzo S.; Dixon T.; Dompé V.; Drobizhev A.; Dumoulin L.; Fantini G.; Faverzani M.; Ferri E.; Ferri F.; Ferroni F.; FigueroaFeliciano E.; Foggetta L.; Formaggio J.; Franceschi A.; Fu C.; Fu S.; Fujikawa B.K.; Gallas A.; Gascon J.; Ghislandi S.; Giachero A.; Gianvecchio A.; Girola M.; Gironi L.; Giuliani A.; Gorla P.; Gotti C.; Grant C.; Gras P.; Guillaumon P.V.; Gutierrez T.D.; Han K.; Hansen E.V.; Heeger K.M.; Helis D.L.; Huang H.Z.; Imbert L.; Johnston J.; Juillard A.; Karapetrov G.; Keppel G.; Khalife H.; Kobychev V.V.; Kolomensky Yu.G.; Konovalov S.I.; Kowalski R.; Langford T.; Lefevre M.; Liu R.; Liu Y.; Loaiza P.; Ma L.; Madhukuttan M.; Mancarella F.; Marini L.; Marnieros S.; Martinez M.; Maruyama R.H.; Mas Ph.; Mayer D.; Mazzitelli G.; Mei Y.; Milana S.; Morganti S.; Napolitano T.; Nastasi M.; Nikkel J.; Nisi S.; Nones C.; Norman E.B.; Novosad V.; Nutini I.; O'Donnell T.; Olivieri E.; Olmi M.; Ouellet J.L.; Pagan S.; Pagliarone C.; Pagnanini L.; Pattavina L.; Pavan M.; Peng H.; Pessina G.; Pettinacci V.; Pira C.; Pirro S.; Poda D.V.; Polischuk O.G.; Ponce I.; Pozzi S.; Previtali E.; Puiu A.; Quitadamo S.; Ressa A.; Rizzoli R.; Rosenfeld C.; Rosier P.; Scarpaci J.A.; Schmidt B.; Sharma V.; Shlegel V.N.; Singh V.; Sisti M.; Slocum P.; Speller D.; Surukuchi P.T.; Taffarello L.; Tomei C.; Torres J.A.; Tretyak V.I.; Tsymbaliuk A.; Velazquez M.; Vetter K.J.; Wagaarachchi S.L.;, Wang G.; Wang L.; Wang R.; Welliver B.; Wilson J.; Wilson K.; Winslow L.A.; Xue M.; Yan L.; Yang J.; Yefremenko V.; Umatov V.I.; Zarytskyy M.M.; Zhang J.; Zolotarova A.; Zucchelli S. | |
| A novel position detector based on nanotechnologies: the NanoChanT project | 1-gen-2006 | Angelucci R; Corticelli F; Cuffiani M; Dallavalle GM; Malferrari L; Montanari A; Odorici F; Rizzoli R; Veronese GP | |
| A ternary-3D analysis of the optical properties of amorphous hydrogenated silicon-rich carbide | 1-gen-2018 | Summonte, C; Gaspari, F; Quaranta, S; Rizzoli, R; Centurioni, E; Canino, M; Polliotti, Ay; Bianconi, M; Desalvo, A | |
| a-Si : H based two-dimensional photonic crystals | 1-gen-2003 | Bennici, E; Ferrero, S; Giorgis, F; Pirri, Cf; Rizzoli, R; Schina, P; Businaro, L; Di Fabrizio, E | |
| a-SiN : H multilayer versus bulk structure: a real improvement of radiative efficiency? | 1-gen-2000 | Rizzoli R;Summonte C;Rava P;Barucca G;Desalvo A;Giorgis; F | |
| Amorphous carbon deposited by pulsed laser ablation as material for cold cathode flat emitters | 1-gen-2002 | Angelucci, R; Rizzoli, R; Salvatori, S; Nicoletti, S; Migliori, A; Brugnoli, E | |
| Amorphous silicon carbide/crystalline silicon heterojunction solar cells: A comprehensive study of the photocarrier collection | 1-gen-1998 | van Cleef; MWM;Rubinelli; FA;Rizzoli R;Pinghini R;Schropp; REI;van der Weg; WF | |
| Amorphous silicon nitrogen alloys deposited by PECVD under hydrogen dilution conditions | 1-gen-1998 | Rava, P; Giuliani, F; Giorgis, F; Pirri, Cf; Tresso, E; Mandracci, P; Summonte, C; Rizzoli, R; Desalvo, A | |
| Amorphous silicon nitrogen alloys deposited by PECVD under hydrogen dilution conditions | 1-gen-1998 | Rava, P; Giuliani, F; Giorgis, F; Pirri, Cf; Tresso, E; Mandracci, P; Summonte, C; Rizzoli, R; Desalvo, A | |
| An Investigation on suprathermal electrons formation in a B-min ECR machine and a novel method for their damping | 1-gen-2013 | D Mascali; L Celona; S Gammino; G Castro; R Miracoli; F P Romano; L Malferrari; F Odorici; R Rizzoli; G P Veronese;T Serafino | |
| An optimized texturing process for silicon solar cell substrates using TMAH | 1-gen-2005 | Iencinella D.; Centurioni E.; Rizzoli R.; Zignani F. | |
| Anatomy of mu c-Si thin films by plasma enhanced chemical vapor deposition: An investigation by spectroscopic ellipsometry | 1-gen-2000 | Losurdo, M; Rizzoli, R; Summonte, C; Cicala, G; Capezzuto, P; Bruno, Giovanni; G, | |
| Annealing Behaviour of High Concentration of Implanted Sb and Sn in Silicon | 1-gen-1986 | G.Weyer; A.Nylandsted Larsen; F.T.Pedersen; R.Galloni; R. Rizzoli | |
| ANOMALOUS DISTRIBUTION OF AS DURING IMPLANTATION IN SILICON UNDER SELF-ANNEALING CONDITIONS | 1-gen-1989 | Lulli, G; Merli, ; Pg, ; Rizzoli, R; Berti, M; Drigo, ; Av, | |
| Application of nanotechnologies in high energy physics | 1-gen-2003 | Angelucci, R.; Corticelli, F.; Cuffiani, M.; Dallavalle, G. M.; Malferrari, L.; Montanari, A.; Montanari, C.; Odorici, F.; Rizzoli, R.; Summonte, C. | |
| Application of nanotechnologies in high energy physics | 1-gen-2003 | Angelucci, R; Corticelli, F; Cuffiani, M; Dallavalle, Gm; Malferrari, L; Montanari, A; Montanari, C; Odorici, F; Rizzoli, R; Summonte, C | |
| BORON AND PHOSPHORUS DOPING OF A-SIC-H THIN-FILMS BY MEANS OF ION-IMPLANTATION | 1-gen-1995 | DEMICHELIS F;CROVINI G;PIRRI; CF;TRESSO E;GALLONI R;SUMMONTE C;RIZZOLI R;ZIGNANI F;RAVA; P | |
| BORON AND PHOSPHORUS ION IMPLANTATION IN A-SIXC1-XH THIN FILMS | 1-gen-1994 | Rizzoli, R; Galloni, R; Summonte, C; Demichelis, F; Pirri, ; Cf, ; Tresso, E; Crovini, G; Rava, P; Zignani, ; F, | |
| Brightness Degradation Controlled by Current Induced Metastable Defect Creation in a-SiC:H Based Light Emitting Diodes | 1-gen-1995 | Rizzoli, R; Summonte, C; Galloni, R; Ruth, M; Desalvo, A; Zignan, F; Rava, P; Demichelis, F; F Pirria, C; Tresso, E; Crovini, G; Giorgis, F; Madan, A | |
| Carbon Nanotubes Array as a Charge Collector of a High Resolution Radiation Sensor | 1-gen-2003 | R. Angelucci; R. Rizzoli; F. Corticelli; W. de Paepe; G.M. Dallavalle; L. Malferrari; A. Montanari; C. Montanari; F. Odorici; M. Cuffiani |