CRICENTI, ANTONIO

CRICENTI, ANTONIO  

Istituto di Struttura della Materia - ISM - Sede Roma Tor Vergata  

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Risultati 1 - 13 di 13 (tempo di esecuzione: 0.049 secondi).
Titolo Data di pubblicazione Autore(i) File
SPM Techniques: Peculiarities and Applications 1-gen-2009 Girasole, M; Longo, G; Pompeo, G; Cricenti, A
Dynamics of Dimers and Adatoms at Silicon and Germanium Surfaces 1-gen-2007 Le Lay, G; Aristov, V Yu; Ronci, F; Colonna, S; Cricenti, A
A New Approach to Characterize Polymeric Nanofilters Contamination 1-gen-2006 Oliva, C; Ustione, A; Cricenti, A; Cecconi, V; Curcio, E
Ab initio study of the Ge(111):Sn surface 1-gen-2006 P. Gori; O. Pulci; A. Cricenti
Micro-radiographs stored in litium fluoride films show strong optical contrast with no topographical contribution 1-gen-2006 Austione, ; Cricenti, A; Bonfigli, F; Flora, F; Lai, A; Marolo, T; M Montereali, R; Baldacchini, G; Faenov, A; Pikuz, T; Reale, L
Lymphoblastoid cells exposed to low-frequency magnetic fields: study by atomic force microscopy. 1-gen-2004 Grimaldi, Settimio; Girasole, Marco; Cricenti, Antonio
Scanning Tunneling Microscopy 1-gen-1992 Selci S;Cricenti A;Righini; M F;Scarselli M;Felici; A C;Ferrari; L
Naked DNA Helicity Observed by Scanning Tunneling Microscopy 1-gen-1990 Cricenti, A; Selci, S; Felici, ; A, C; Generosi, R; Gori, E; Djaczenko, W; Chiarotti, ; G,
Scanning Tunneling Microscopy 1-gen-1989 Selci S;Cricenti A;Felici; AC;Chiarotti G;Generosi R;Gori; E
FAST AIR OPERATING SCANNING TUNNELING MICROSCOPE 1-gen-1988 Selci S;Cricenti A;Generosi R;Gori E;Chiarotti; G
Anisotropic Reflectivity of Surface States in Semiconductors 1-gen-1985 Chiaradia, P; Cricenti, A; Chiarotti, G; Ciccacci, F; Selci, Stefano; S,
Electronic Surface Transitions in Si (111) 2×1 Studied by Polarized Light 1-gen-1985 Cricenti A;Ciccacci F;Selci S;Chiaradia P;Chiarotti; G
Optical Transitions and Surface Structure 1-gen-1985 Chiaradia P;Cricenti A;Chiarotti G;Ciccacci F;Selci; S