BISIO, FRANCESCO
BISIO, FRANCESCO
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
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High-Order photoemission from metal surfaces
2010 Winkelmann, A; Chiang, Ct; Bisio, F; Lin, Wc; Kirschner, J; Petek, H
Thickness and Beyond. Exploiting Spectroscopic Ellipsometry and Atomic Force Nanolithography for the Investigation of Ultrathin Interfaces of Biologic Interest
2018 Parisse, P; Solano, I; Magnozzi, M; Bisio, F; Casalis, L; Cavalleri, O; Canepa, M
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| High-Order photoemission from metal surfaces | 1-gen-2010 | Winkelmann, A; Chiang, Ct; Bisio, F; Lin, Wc; Kirschner, J; Petek, H | |
| Thickness and Beyond. Exploiting Spectroscopic Ellipsometry and Atomic Force Nanolithography for the Investigation of Ultrathin Interfaces of Biologic Interest | 1-gen-2018 | Parisse, P; Solano, I; Magnozzi, M; Bisio, F; Casalis, L; Cavalleri, O; Canepa, M |