BUZIO, RENATO
BUZIO, RENATO
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
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Risultati 1 - 8 di 8 (tempo di esecuzione: 0.02 secondi).
Exploring Mesoscale Contact Mechanics by Atomic Force Microscopy
2013 Renato Buzio
Dry friction phenomena at the nanoscale
2011 Renato Buzio ; Bruno Torre ; Lorenzo Bruschi ; Giampaolo Mistura ; Ugo Valbusa ;
Nanolubrication studied by contact-mode atomic force microscopy
2007 Buzio, R; Valbusa, U
Poly(dimethylsiloxane) colloidal AFM probes: a new tool for mescoscale contact mechanics investigations
2007 Renato Buzio;Ugo Valbusa
Probing contact mechanics at the mesoscale by atomic force microscopy
2007 Buzio, Renato; Valbusa, Ugo
The Role of Nanoroughness in Contact Mechanics
2007 Renato Buzio ; Ugo Valbusa
Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy
2006 Buzio, Renato; Valbusa, Ugo
A fractal approach to the contact mechanics of randomly rough surfaces
2003 Buzio, R; Boragno, C; Biscarini, F; Buatier de Mongeot, F; Valbusa, U
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Exploring Mesoscale Contact Mechanics by Atomic Force Microscopy | 1-gen-2013 | Renato Buzio | |
| Dry friction phenomena at the nanoscale | 1-gen-2011 | Renato Buzio ; Bruno Torre ; Lorenzo Bruschi ; Giampaolo Mistura ; Ugo Valbusa ; | |
| Nanolubrication studied by contact-mode atomic force microscopy | 1-gen-2007 | Buzio, R; Valbusa, U | |
| Poly(dimethylsiloxane) colloidal AFM probes: a new tool for mescoscale contact mechanics investigations | 1-gen-2007 | Renato Buzio;Ugo Valbusa | |
| Probing contact mechanics at the mesoscale by atomic force microscopy | 1-gen-2007 | Buzio, Renato; Valbusa, Ugo | |
| The Role of Nanoroughness in Contact Mechanics | 1-gen-2007 | Renato Buzio ; Ugo Valbusa | |
| Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy | 1-gen-2006 | Buzio, Renato; Valbusa, Ugo | |
| A fractal approach to the contact mechanics of randomly rough surfaces | 1-gen-2003 | Buzio, R; Boragno, C; Biscarini, F; Buatier de Mongeot, F; Valbusa, U |