SEGUINI, GABRIELE
SEGUINI, GABRIELE
Istituto per la Microelettronica e Microsistemi - IMM
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Experimental determination of the band offset of rare earth oxides on various semiconductors
2007 Seguini, Gabriele; Perego, Michele; Fanciulli, Marco
Physical, Chemical, and Electrical Characterization of High-? Dielectrics on Ge and GaAs
2007 Spiga, S; Wiemer, C; Scarel, G; Seguini, G; Fanciulli, M; Zenkevich, A; Lebedinskii, Yu
Defects at the high-k/semiconductor interfaces investigated by spin dependent spectroscopies
2006 Fanciulli, ; Marco, ; Costa, ; Omar, ; Baldovino, ; Silvia, ; Cocco, Simone; Cocco, Simone; Seguini, Gabriele; Seguini, Gabriele; Prati, Enrico; Prati, Enrico; Scarel, ; Giovanna,
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Experimental determination of the band offset of rare earth oxides on various semiconductors | 1-gen-2007 | Seguini, Gabriele; Perego, Michele; Fanciulli, Marco | |
Physical, Chemical, and Electrical Characterization of High-? Dielectrics on Ge and GaAs | 1-gen-2007 | Spiga, S; Wiemer, C; Scarel, G; Seguini, G; Fanciulli, M; Zenkevich, A; Lebedinskii, Yu | |
Defects at the high-k/semiconductor interfaces investigated by spin dependent spectroscopies | 1-gen-2006 | Fanciulli, ; Marco, ; Costa, ; Omar, ; Baldovino, ; Silvia, ; Cocco, Simone; Cocco, Simone; Seguini, Gabriele; Seguini, Gabriele; Prati, Enrico; Prati, Enrico; Scarel, ; Giovanna, |