In the present work we demonstrate that the new portable system PIXE - ALPHA recently designed and realised through a collaboration between the DAMRI-SACLAY (France) and the LNS laboratory (Italy) gives the possibility of a non destructive and careful analysis of pigments and it is particularly suited in the characterization of the black gloss present in Attic pottery. This because PIXE analysis is sensitive to light elements and concerns only the surface layers; as it is known the major elements present in the black gloss range from Na to Fe.

Black gloss characterization of Greek Attic pottery carried out by means of the new non-destructive PIXE-alpha portable system

Romano Francesco Paolo;
2000

Abstract

In the present work we demonstrate that the new portable system PIXE - ALPHA recently designed and realised through a collaboration between the DAMRI-SACLAY (France) and the LNS laboratory (Italy) gives the possibility of a non destructive and careful analysis of pigments and it is particularly suited in the characterization of the black gloss present in Attic pottery. This because PIXE analysis is sensitive to light elements and concerns only the surface layers; as it is known the major elements present in the black gloss range from Na to Fe.
2000
Istituto per i Beni Archeologici e Monumentali - IBAM - Sede Catania
Istituto di Scienze del Patrimonio Culturale - ISPC
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/130301
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