CNR Institutional Research Information System

ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry -- Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

P Colombi;DK Agnihotri;VE Asadchikov;E Bontempi;D K Bowen;CH Chang;L E Depero;M Farnworth;T Fujimoto;A Gibaud;M Jergel;M Krumrey;T A Lafford;A Lamperti;T Ma;R J Matyi;M Meduna;S Milita;K Sakurai;L Shabel'nikov;A Ulyanenkov;A Van der Lee;C Wiemer

2013