This document describes in detail the test harness and procedure followed to evaluate the long-term reliability and performance of the lwIP protocol stack on the FreeRTOS operating system and an NXP LPC 24xx/17xx microcontroller, in view of its adoption as a reusable module within ongoing Velex firmware development projects. In particular, it discusses which tests have been performed, their results, and any corrective action undertaken as a consequence.
Long-term reliability and performance of lwIP on FreeRTOS and NXP LPC 24xx/17xx
Tingting Hu;Ivan Cibrario Bertolotti
2012
Abstract
This document describes in detail the test harness and procedure followed to evaluate the long-term reliability and performance of the lwIP protocol stack on the FreeRTOS operating system and an NXP LPC 24xx/17xx microcontroller, in view of its adoption as a reusable module within ongoing Velex firmware development projects. In particular, it discusses which tests have been performed, their results, and any corrective action undertaken as a consequence.File in questo prodotto:
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