The High Voltage RadioFrequency Test Facility (HVRFTF) [1] has been developed with the aim to be a simple, accessible and flexible test facility to characterize the dielectric strength in vacuum of the RF drivers of SPIDER and MITICA ion source and effectively address the issues related to the ir voltage hold off when subjected to their operating radiofrequency E - fields and pressure . This report presen ts the studies for the definition of driver mockups to be used as Device Under Test (DUT) within HVRFTF. Different geometries are assumed as possible mockups and their E - fields are calculated by means of electrostatic analyses. The best configuration worke d out for the scope is based on a couple of electrodes (one plane and one spherical) with a dielectric material in between. However, the studies highlighted that a single sphere diameter is not sufficiently accurate to cover the entire gap range of interes t; in particular the sphere diameter has to be increased as far as the gap increases. Nevertheless, three of these DUTs can allow reproducing the E - field trend of the driver.
Studies for the definition of driver mockups for HVRFTF
Recchia M;
2017
Abstract
The High Voltage RadioFrequency Test Facility (HVRFTF) [1] has been developed with the aim to be a simple, accessible and flexible test facility to characterize the dielectric strength in vacuum of the RF drivers of SPIDER and MITICA ion source and effectively address the issues related to the ir voltage hold off when subjected to their operating radiofrequency E - fields and pressure . This report presen ts the studies for the definition of driver mockups to be used as Device Under Test (DUT) within HVRFTF. Different geometries are assumed as possible mockups and their E - fields are calculated by means of electrostatic analyses. The best configuration worke d out for the scope is based on a couple of electrodes (one plane and one spherical) with a dielectric material in between. However, the studies highlighted that a single sphere diameter is not sufficiently accurate to cover the entire gap range of interes t; in particular the sphere diameter has to be increased as far as the gap increases. Nevertheless, three of these DUTs can allow reproducing the E - field trend of the driver.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
