The present contribution describes the activity performed by RFX personnel at IPP-Garching devoted to the characterisation of the negative ion beam produced in BATMAN Upgrade and specifically to the comparison of the measurements provided by mini-STRIKE and by Beam Emission Spectroscopy. The direct comparison of measurements of single beamlets are very similar; differences are found when the Beam Emission Spectroscopy diagnostic integrated over several beamlets.
Single Beamlet divergence measurement at BATMAN Upgrade by mini-STRIKE and Beam Emission Spectroscopy
Agostini M;Barbisan M;Brombin M;
2019
Abstract
The present contribution describes the activity performed by RFX personnel at IPP-Garching devoted to the characterisation of the negative ion beam produced in BATMAN Upgrade and specifically to the comparison of the measurements provided by mini-STRIKE and by Beam Emission Spectroscopy. The direct comparison of measurements of single beamlets are very similar; differences are found when the Beam Emission Spectroscopy diagnostic integrated over several beamlets.File in questo prodotto:
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