The present technical report is mainly focused on the microstructural analysis of SiC sintered products. The main objectives are the analysis of analysis of surface and inner morphology, type and amount of secondary phases, defects and porosity in dense products by scanning electron microscopy.
Analisi di anelli di carburo di silicio
Sciti Diletta;Silvestroni Laura;Melandri Cesare
2011
Abstract
The present technical report is mainly focused on the microstructural analysis of SiC sintered products. The main objectives are the analysis of analysis of surface and inner morphology, type and amount of secondary phases, defects and porosity in dense products by scanning electron microscopy.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.