BOCCHI, CLAUDIO
BOCCHI, CLAUDIO
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
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Chapter 4: Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction
2008 Ferrari, C; Bocchi, C
Study of InAs/GaAs stacked quantum dots by high resolution X-ray diffraction techniques
2008 Germini F.; Bocchi C.
HIGH-RESOLUTION INTERFACE CHARACTERIZATION OF III-V HETEROSTRUCTURES
1991 Bocchi, C; Ferrari, C; Franzosi, P; Lazzarini, L; Salviati, G; Scaffardi, M
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Chapter 4: Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction | 1-gen-2008 | Ferrari, C; Bocchi, C | |
| Study of InAs/GaAs stacked quantum dots by high resolution X-ray diffraction techniques | 1-gen-2008 | Germini F.; Bocchi C. | |
| HIGH-RESOLUTION INTERFACE CHARACTERIZATION OF III-V HETEROSTRUCTURES | 1-gen-1991 | Bocchi, C; Ferrari, C; Franzosi, P; Lazzarini, L; Salviati, G; Scaffardi, M |