NAPOLITANI, ENRICO
NAPOLITANI, ENRICO
Istituto per la Microelettronica e Microsistemi - IMM
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Ion Implantation Defects and Shallow Junctions in Si and Ge
2015 Napolitani, Enrico; Impellizzeri, Giuliana
Preface for Proceedings of SIMS XVIII, Riva del Garda, Italy, 2011
2013 Napolitani, Enrico; Giubertoni, Damiano; Bersani, Massimo; Anderle, Mariano; Licciardello, Antonino
Structural characterization of light elements in semiconductor materials by means of selected nuclear reactions
2008 Berti, M; Bisognin, G; De Salvador, D; Napolitani, E
Si-based materials for advanced microelectronic devices: Synthesis, defects and diffusion
2006 Napolitani, Enrico; Napolitani, Enrico; Kuznetsov, ; Andrej, ; Skorupa, ; Wolfgang, ; Foad, ; Majeed,
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Ion Implantation Defects and Shallow Junctions in Si and Ge | 1-gen-2015 | Napolitani, Enrico; Impellizzeri, Giuliana | |
| Preface for Proceedings of SIMS XVIII, Riva del Garda, Italy, 2011 | 1-gen-2013 | Napolitani, Enrico; Giubertoni, Damiano; Bersani, Massimo; Anderle, Mariano; Licciardello, Antonino | |
| Structural characterization of light elements in semiconductor materials by means of selected nuclear reactions | 1-gen-2008 | Berti, M; Bisognin, G; De Salvador, D; Napolitani, E | |
| Si-based materials for advanced microelectronic devices: Synthesis, defects and diffusion | 1-gen-2006 | Napolitani, Enrico; Napolitani, Enrico; Kuznetsov, ; Andrej, ; Skorupa, ; Wolfgang, ; Foad, ; Majeed, |