RANJAN, RAJEEV
RANJAN, RAJEEV
Istituto per la Microelettronica e Microsistemi - IMM
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Stimulated Raman Scattering Microscopy: A Review
2024 Ranjan, R.; Sirleto, L.
Noise Measurements and Noise Statistical Properties Investigations in a Stimulated Raman Scattering Microscope Based on Three Femtoseconds Laser Sources
2022 Ranjan, Rajeev; Costa, Giovanni; Ferrara, MARIA ANTONIETTA; Sansone, Mario; Sirleto, Luigi
Noises investigations and image denoising in femtosecond stimulated Raman scattering microscopy
2022 Ranjan, R.; Costa, G.; Ferrara, M. A.; Sansone, M.; Sirleto, L.
Analysis of pulses bandwidth and spectral resolution in femtosecond stimulated Raman scattering microscopy
2021 Sirleto, L.; Ranjan, R.; Ferrara, M. A.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Stimulated Raman Scattering Microscopy: A Review | 1-gen-2024 | Ranjan, R.; Sirleto, L. | |
Noise Measurements and Noise Statistical Properties Investigations in a Stimulated Raman Scattering Microscope Based on Three Femtoseconds Laser Sources | 1-gen-2022 | Ranjan, Rajeev; Costa, Giovanni; Ferrara, MARIA ANTONIETTA; Sansone, Mario; Sirleto, Luigi | |
Noises investigations and image denoising in femtosecond stimulated Raman scattering microscopy | 1-gen-2022 | Ranjan, R.; Costa, G.; Ferrara, M. A.; Sansone, M.; Sirleto, L. | |
Analysis of pulses bandwidth and spectral resolution in femtosecond stimulated Raman scattering microscopy | 1-gen-2021 | Sirleto, L.; Ranjan, R.; Ferrara, M. A. |