MELI, ALESSANDRO
MELI, ALESSANDRO
Istituto per la Microelettronica e Microsistemi - IMM
Performance of a thick 250 mi m silicon carbide detector: stability and energy resolution
2023 Kushoro, M. H.; Rebai, M.; La Via, F.; Meli, A.; Meda, L.; Parisi, M.; Perelli Cippo, E.; Putignano, O.; Trotta, A.; Tardocchi, M.
Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications
2022 Meli, A.; Muoio, A.; Reitano, R.; Sangregorio, E.; Calcagno, L.; Trotta, A.; Parisi, M.; Meda, L.; La Via, F.
Optical Characterization of 4H-SiC Thick Epitaxial Layer for Particle Detection
2022 Meli, A.; Muoio, A.; Riccardo, R.; Trotta, A.; Parisi, M.; Meda, L.; La Via, F.
Detector Response to D-D Neutrons and Stability Measurements with 4H Silicon Carbide Detectors
2021 Kushoro, Matteo Hakeem; Rebai, Marica; Tardocchi, Marco; Altana, Carmen; Cazzaniga, Carlo; De Marchi, Eliana; La Via, Francesco; Meda, Laura; Meli, Alessandro; Parisi, Miriam; Perelli Cippo, Enrico; Pillon, Mario; Trotta, Antonio; Tudisco, Salvo; Gorini, Giuseppe
Epitaxial Growth and Characterization of 4H-SiC for Neutron Detection Applications
2021 Meli, Alessandro; Muoio, Annamaria; Trotta, Antonio; Meda, Laura; Parisi, Miriam; LA VIA, Francesco
Crystallization of nano amorphized regions in thin epitaxial layer of Ge2Sb2Te5
2020 D'Arrigo, G; Mio, ANTONIO MASSIMILIANO; Boschker, J E; Meli, A; Cecchi, S; Zallo, E; Sciuto, A; Buscema, M; Bruno, E; Calarco, R; Rimini, E
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Performance of a thick 250 mi m silicon carbide detector: stability and energy resolution | 1-gen-2023 | Kushoro, M. H.; Rebai, M.; La Via, F.; Meli, A.; Meda, L.; Parisi, M.; Perelli Cippo, E.; Putignano, O.; Trotta, A.; Tardocchi, M. | |
| Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications | 1-gen-2022 | Meli, A.; Muoio, A.; Reitano, R.; Sangregorio, E.; Calcagno, L.; Trotta, A.; Parisi, M.; Meda, L.; La Via, F. | |
| Optical Characterization of 4H-SiC Thick Epitaxial Layer for Particle Detection | 1-gen-2022 | Meli, A.; Muoio, A.; Riccardo, R.; Trotta, A.; Parisi, M.; Meda, L.; La Via, F. | |
| Detector Response to D-D Neutrons and Stability Measurements with 4H Silicon Carbide Detectors | 1-gen-2021 | Kushoro, Matteo Hakeem; Rebai, Marica; Tardocchi, Marco; Altana, Carmen; Cazzaniga, Carlo; De Marchi, Eliana; La Via, Francesco; Meda, Laura; Meli, Alessandro; Parisi, Miriam; Perelli Cippo, Enrico; Pillon, Mario; Trotta, Antonio; Tudisco, Salvo; Gorini, Giuseppe | |
| Epitaxial Growth and Characterization of 4H-SiC for Neutron Detection Applications | 1-gen-2021 | Meli, Alessandro; Muoio, Annamaria; Trotta, Antonio; Meda, Laura; Parisi, Miriam; LA VIA, Francesco | |
| Crystallization of nano amorphized regions in thin epitaxial layer of Ge2Sb2Te5 | 1-gen-2020 | D'Arrigo, G; Mio, ANTONIO MASSIMILIANO; Boschker, J E; Meli, A; Cecchi, S; Zallo, E; Sciuto, A; Buscema, M; Bruno, E; Calarco, R; Rimini, E |