MELI, ALESSANDRO
MELI, ALESSANDRO
Istituto per la Microelettronica e Microsistemi - IMM
Performance of a thick 250 mi m silicon carbide detector: stability and energy resolution
2023 Kushoro, M. H.; Rebai, M.; La Via, F.; Meli, A.; Meda, L.; Parisi, M.; Perelli Cippo, E.; Putignano, O.; Trotta, A.; Tardocchi, M.
Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications
2022 Meli, A.; Muoio, A.; Reitano, R.; Sangregorio, E.; Calcagno, L.; Trotta, A.; Parisi, M.; Meda, L.; La Via, F.
Detector Response to D-D Neutrons and Stability Measurements with 4H Silicon Carbide Detectors
2021 Kushoro, Matteo Hakeem; Rebai, Marica; Tardocchi, Marco; Altana, Carmen; Cazzaniga, Carlo; De Marchi, Eliana; La Via, Francesco; Meda, Laura; Meli, Alessandro; Parisi, Miriam; Perelli Cippo, Enrico; Pillon, Mario; Trotta, Antonio; Tudisco, Salvo; Gorini, Giuseppe
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Performance of a thick 250 mi m silicon carbide detector: stability and energy resolution | 1-gen-2023 | Kushoro, M. H.; Rebai, M.; La Via, F.; Meli, A.; Meda, L.; Parisi, M.; Perelli Cippo, E.; Putignano, O.; Trotta, A.; Tardocchi, M. | |
| Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications | 1-gen-2022 | Meli, A.; Muoio, A.; Reitano, R.; Sangregorio, E.; Calcagno, L.; Trotta, A.; Parisi, M.; Meda, L.; La Via, F. | |
| Detector Response to D-D Neutrons and Stability Measurements with 4H Silicon Carbide Detectors | 1-gen-2021 | Kushoro, Matteo Hakeem; Rebai, Marica; Tardocchi, Marco; Altana, Carmen; Cazzaniga, Carlo; De Marchi, Eliana; La Via, Francesco; Meda, Laura; Meli, Alessandro; Parisi, Miriam; Perelli Cippo, Enrico; Pillon, Mario; Trotta, Antonio; Tudisco, Salvo; Gorini, Giuseppe |