RAINERI, VITO
RAINERI, VITO
Istituto per la Microelettronica e Microsistemi - IMM
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Fundamentals and Technology of Multifunctional Oxide Thin Film
2010 P. Muralt; V. Raineri; M Kosec; S. Ravesi
Nanoscale imaging and metrology of devices and innovative materials
2007 Raineri, V; Spinella, C; Vandervorst, W
Advanced characterisation of materials and devices
2003 Raineri, V; Vandervorst, W; Rosenwacks, Y
Advanced characterisation of semiconductor materials
2001 Raineri V; Vandervorst W; Srinivasan A; Ciappa M.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Fundamentals and Technology of Multifunctional Oxide Thin Film | 1-gen-2010 | P. Muralt; V. Raineri; M Kosec; S. Ravesi | |
Nanoscale imaging and metrology of devices and innovative materials | 1-gen-2007 | Raineri, V; Spinella, C; Vandervorst, W | |
Advanced characterisation of materials and devices | 1-gen-2003 | Raineri, V; Vandervorst, W; Rosenwacks, Y | |
Advanced characterisation of semiconductor materials | 1-gen-2001 | Raineri V; Vandervorst W; Srinivasan A; Ciappa M. |