RAINERI, VITO
RAINERI, VITO
Istituto per la Microelettronica e Microsistemi - IMM
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Risultati 1 - 7 di 7 (tempo di esecuzione: 0.013 secondi).
Electronic properties of graphene probed at the nanoscale
2011 Giannazzo, F; Sonde, S; Raineri, V
Praseodymium based dielectrics: Metal-Organic Chemical Vapor Deposition (MOCVD) growth, characterization and applications
2011 LO NIGRO, Raffaella; Malandrino, G; Toro, Rg; Fiorenza, P; Raineri, V
Transport properties of graphene with nanoscale lateral resolution
2011 F. Giannazzo; V. Raineri; E. Rimini.
Colossal permittivity in advanced functional heterogeneous materials: the relevance of the local measurements at submicron scale
2010 Fiorenza, Patrick; LO NIGRO, Raffaella; Raineri, Vito
Self-assembled metal nanostructures in semiconductor structures
2009 Ruffino, F; Giannazzo, F; Roccaforte, F; Raineri, V; Grimaldi, Mg
Carrier transport in advanced semiconductor materials
2008 Filippo Giannazzo; Patrick Fiorenza; Vito Raineri
Ohmic contacts to SiC
2006 F. Roccaforte; F. La Via; V. Raineri
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Electronic properties of graphene probed at the nanoscale | 1-gen-2011 | Giannazzo, F; Sonde, S; Raineri, V | |
| Praseodymium based dielectrics: Metal-Organic Chemical Vapor Deposition (MOCVD) growth, characterization and applications | 1-gen-2011 | LO NIGRO, Raffaella; Malandrino, G; Toro, Rg; Fiorenza, P; Raineri, V | |
| Transport properties of graphene with nanoscale lateral resolution | 1-gen-2011 | F. Giannazzo; V. Raineri; E. Rimini. | |
| Colossal permittivity in advanced functional heterogeneous materials: the relevance of the local measurements at submicron scale | 1-gen-2010 | Fiorenza, Patrick; LO NIGRO, Raffaella; Raineri, Vito | |
| Self-assembled metal nanostructures in semiconductor structures | 1-gen-2009 | Ruffino, F; Giannazzo, F; Roccaforte, F; Raineri, V; Grimaldi, Mg | |
| Carrier transport in advanced semiconductor materials | 1-gen-2008 | Filippo Giannazzo; Patrick Fiorenza; Vito Raineri | |
| Ohmic contacts to SiC | 1-gen-2006 | F. Roccaforte; F. La Via; V. Raineri |