SCORZONI, ANDREA

SCORZONI, ANDREA  

Istituto per la Microelettronica e Microsistemi - IMM - Sede Secondaria Bologna  

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Risultati 1 - 20 di 31 (tempo di esecuzione: 0.047 secondi).
Titolo Data di pubblicazione Autore(i) File
Mobility Gaps of Hydrogenated Amorphous Silicon Related to Hydrogen Concentration and Its Influence on Electrical Performance 1-gen-2024 Peverini, F.; Aziz, S.; Bashiri, A.; Bizzarri, M.; Boscardin, M.; Calcagnile, L.; Calcatelli, C.; Calvo, D.; Caponi, S.; Caprai, M.; Caputo, D.; Caricato, A. P.; Catalano, R.; Cirro, R.; Cirrone, G. A. P.; Crivellari, M.; Croci, T.; Cuttone, G.; de Cesare, G.; De Remigis, P.; Dunand, S.; Fabi, M.; Frontini, L.; Fano, L.; Gianfelici, B.; Grimani, C.; Hammad, O.; Ionica, M.; Kanxheri, K.; Large, M.; Lenta, F.; Liberali, V.; Lovecchio, N.; Martino, M.; Maruccio, G.; Mazza, G.; Menichelli, M.; Monteduro, A. G.; Moscatelli, F.; Morozzi, A.; Nascetti, A.; Pallotta, S.; Papi, A.; Passeri, D.; Petasecca, M.; Petringa, G.; Pis, I.; Placidi, P.; Quarta, G.; Rizzato, S.; Rossi, A.; Rossi, G.; Sabbatini, F.; Scorzoni, A.; Servoli, L.; Stabile, A.; Tacchi, S.; Talamonti, C.; Thomet, J.; Tosti, L.; Verzellesi, G.; Villani, M.; Wheadon, R. J.; Wyrsch, N.; Zema, N.; Pedio, M.
Thermal Conductivity Detector for Gas Chromatography: Very Wide Gain Range Acquisition System and Experimental Measurements 1-gen-2013 Rastrello, Fabio; Placidi, Pisana; Scorzoni, Andrea; Cozzani, Enrico; Messina, Marco; Elmi, Ivan; Zampolli, Stefano; Cardinali, GIAN CARLO
Thermal conductivity detector compact Spice model based on experimental measurements and 3D simulations 1-gen-2012 Rastrello, F; Placidi, P; Scorzoni, A; Cozzani, E; Messina, M; Elmi, I; Zampolli, S; Cardinali, GIAN CARLO
A Programmable Interface Circuit for an Ultralow Power Gas Sensor 1-gen-2011 Bissi L; Cicioni M; Placidi P; Zampolli S; Elmi I; Scorzoni A
Ultra-low-power components for an RFID Tag with physical and chemical sensors 1-gen-2008 Zampolli, S; Elmi, I; Cozzani, E; Cardinali, Gc; Scorzoni, A; Cicioni, M; Marco, S; Palacio, F; Gómezcama, J; Sayhan, I; Becker, T
A smart gas sensor for environmental monitoring, compliant with the IEEE 1451 standard and featuring a simplified transducer interface 1-gen-2007 Bissi, Lucia; Scorzoni, Andrea; Placidi, Pisana; Marrocchi, Luca; Cicioni, Michele; Roselli, Luca; Zampolli, Stefano; Masini, Luca; Elmi, Ivan; Cardinali, GIAN CARLO
An RFID reader with onboard sensing capability for monitoring fruit quality 1-gen-2007 Vergara A; Llobet E; Ramirez JL; Ivanova P; Fonseca L; Zampolli S; Scorzoni A; Becker T; Marco S; Woellenstein J
Annealing Effects on Leakage Current and Epilayer Doping Concentration of p+n Junction 4H-SiC Diodes after Very High Neutron Irradiation 1-gen-2007 Moscatelli F; Scorzoni A; Poggi A; Nipoti R
Effects of very high neutron fluence irradiation on p+n junction 4H-SiC diodes 1-gen-2007 Moscatelli, F; Scorzoni, A; Poggi, A; Passini, M; Pizzocchero, G; Nipoti, R
Electromigration Reliability Assessment of Cu-based Metallization Systems by a Wafer-Level Approach 1-gen-2007 Impronta, M; Marras, A; De Munari, I; Scorzoni, A; Valentini, Mg
Environmental monitoring system compliant with the IEEE 1451 standard and featuring a simplified transducer interface 1-gen-2007 Bissi, L; Placidi, P; Scorzoni, A; Elmi, I; Zampolli, S
Flexible tag microlab development: Gas sensors integration in RFID flexible tags for food logistic 1-gen-2007 Abad, E; Zampolli, S; Marco, S; Scorzoni, A; Mazzolai, B; Juarros, A; Gomez, D; Elmi, I; Cardinali, Gc; Gomez, Jm; Palacio, F; Cicioni, M; Mondini, A; Becker, T; Sayhan, I
Offset Voltage Evaluation of Analog Blocks in a Configurable Mixed Architecture for Smart Capacitive Sensor Applications 1-gen-2007 Bissi L.; Placidi P.; Scorzoni A.
Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests 1-gen-2007 Marras A; Impronta M; De Munari I; Valentini MG; Scorzoni A
Interfacial properties of SiO2 grown on 4H-SiC: comparison between N2O and Wet O2 oxidation ambient 1-gen-2006 Poggi A; Moscatelli F; Scorzoni A; Marino G; Nipoti R; Sanmartin M
Minimum ionizing particle detector based on p+n junction SiC diode 1-gen-2006 Moscatelli, F; Scorzoni, A; Poggi, A; Bruzzi, M; Logomarsino, S; Sciortino, S; Wagner, G; Nipoti, R
Radiation hardness after very high neutron irradiation of minimum ionizing particle detectors based on 4H-SiC p(+)n junctions 1-gen-2006 Moscatelli, F; Scorzoni, A; Poggi, A; Bruzzi, M; Sciortino, S; Lagomarsino, S; Wagner, G; Mandic, I; Nipoti, R
Development of radiation tolerant semiconductor detectors for the Super-LHC 1-gen-2005 M. Moll; J. Adey; A. AlAjili; G. Alfieri; P.P. Allport; M. Artuso; S. Assouak; B.S. Avset; L. Barabash; A. Barcz; R. Bates; S.F. Biagi; G.M. Bilei; D. Bisello; A. Blue; A. Blumenau; V. Boisvert; G. Bolla; G. Bondarenko; E. Borchi; L. Borrello; D. Bortoletto; M. Boscardin; L. Bosisio; T.J.V. Bowcock; T.J. Brodbeck; J. Broz; M. Bruzzi ; A. Brzozowski; M. Buda; P. Buhmann; C. Buttar; F. Campabadal; D. Campbell; A. Candelori; G. Casse; A. Cavallini; S. Charron; A. Chilingarov; D. Chren; V. Cindro; P. Collins; R. Coluccia; D. Contarato; J. Coutinho; D. Creanza; W. Cunningham; G. F. Dalla Betta; I. Dawson; W. de Boer; M. De Palma; R. Demina; P. Dervan; S. Dittongo; Z. Dolezal; A. Dolgolenko; T. Eberlein; V. Eremin; C. Fall; F. Fasolo; F. Fizzotti; C. Fleta; E. Focardi; E. Forton; E. Fretwurst; C. Garcia; J.E. GarciaNavarro; E. Gaubas; M. H. Genest; K.A. Gill; K. Giolo; M. Glaser; C. Goessling; V. Golovine; S. Gonza lez Sevilla; I. Gorelov; J. Goss; A. Gouldwell Bates; G. Gregoire; P. Gregori; E. Grigoriev; A.A. Grillo; A. Groza; J. Guskov; L. Haddad; J. Ha rko nen; F. Hauler; M. Hoeferkamp; F. Ho nniger; T. Horazdovsky; R. Horisberger; M. Horn; A. Houdayer; B. Hourahine; G. Hughes; I. Ilyashenko; K. Irmscher; A. Ivanov; K. Jarasiunas; K.M.H. Johansen; B.K. Jones; R. Jones; C. Joram; L. Jungermann; E. Kalinina; P. Kaminski; A. Karpenko; A. Karpov; V. Kazlauskiene; V. Kazukauskas; V. Khivrich; V. Khomenkov; J. Kierstead; J. KlaiberLodewigs; R. Klingenberg; P. Kodys; Z. Kohout; S. Korjenevski; M. Koski; R. Kozlowski; M. Kozodaev; G. Kramberger; O. Krasel; A. Kuznetsov; S. Kwan; S. Lagomarsino; K. LassilaPerini; V. Lastovetsky; G. Latino; S. Lazanu; I. Lazanu; A. Lebedev; C. Lebel; K. Leinonen; C. Leroy; Z. Li; G. Lindstrom; V. Linhart; A. Litovchenko; P. Litovchenko; A. Lo Giudice; M. Lozano; Z. Luczynski; P. Luukka; A. Macchiolo; L.F. Makarenko; I. Mandic ; C. Manfredotti; N. Manna; S. Marti i Garcia; S. Marunko; K. Mathieson; J. Melone; D. Menichelli; A. Messineo; J. Metcalfe; S. Miglio; M. Mikuz ; J. Miyamoto; E. Monakhov; F. Moscatelli; D. Naoumov; E. NossarzewskaOrlowska; J. Nysten; P. Olivero; V. OShea; T. Palviainen; C. Paolini; C. Parkes; D. Passeri; U. Pein; G. Pellegrini; L. Perera; M. Petasecca; C. Piemonte; G.U. Pignatel; N. Pinho; I. Pintilie; L. Pintilie; L. Polivtsev; P. Polozov; A. Popa; J. Popule; S. Pospisil; A. Pozza; V. Radicci; J.M. Raf; R. Rando; R. Roeder; T. Rohe; S. Ronchin; C. Rott; A. Roy; A. Ruzin; H.F.W. Sadrozinski; S. Sakalauskas; M. Scaringella; L. Schiavulli; S. Schnetzer; B. Schumm; S. Sciortino; A. Scorzoni; G. Segneri; S. Seidel; A. Seiden; G. Sellberg; P. Sellin; D. Sentenac; I. Shipsey; P. Sicho; T. Sloan; M. Solar; S. Son; B. Sopko; V. Sopko; N. Spencer; J. Stahl; D. Stolze; R. Stone; J. Storasta; N. Strokan; M. Sudzius; B. Surma; A. Suvorov; B.G. Svensson; P. Tipton; M. Tomasek; A. Tsvetkov; E. Tuominen; E. Tuovinen; T. Tuuva; M. Tylchin; H. Uebersee; J. Uher; M. Ullan;J.V. Vaitkus; J. Velthuis; E. Verbitskaya; V. Vrba; G. Wagner; I. Wilhelm; S. Worm; V. Wright; R. Wunstorf; Y. Yiuri; P. Zabierowski; A. Zaluzhny; M. Zavrtanik; M. Zen; V. Zhukov; N. Zorzi
Measurements and simulations of charge collection efficiency of p(+)/n junction SiC detectors 1-gen-2005 Moscatelli, F; Scorzoni, A; Poggi, A Bruzzi M; Lagomarsino, S; Mersi, S; Sciortino, S; Nipoti, R
Measurements of charge collection efficiency of p(+)/n junction SiC detectors 1-gen-2005 Moscatelli, F; Scorzoni, A; Poggi, A; Bruzzi, M; Lagomarsino, S; Mersi, S; Sciortino, S; Lazar, M; Di Placido, A; Nipoti, R