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MERLI, PIER GIORGIO

MERLI, PIER GIORGIO  

Istituto per la Microelettronica e Microsistemi - IMM  

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Risultati 1 - 20 di 46 (tempo di esecuzione: 0.024 secondi).
Titolo Data di pubblicazione Autore(i) File
Conductive Sub-micrometric Wires of Platinum-Carbonyl Clusters Fabricated by Soft-lithography 1-gen-2008 Greco, P; Cavallini, M; Stoliar, P; Quiroga, Sd; Dutta, S; Zacchini, S; Iapalucci, Mc; Morandi, V; Milita, S; Merli, Pg; Biscarini, F
Quantitative determination of the dopant distribution in Si ultrashallow junctions by tilted sample annular dark field scanning transmission electron microscopy 1-gen-2008 Parisini, A; Morandi, V; Solmi, S; Merli, Pg; Giubertoni, D; Bersani, M; van den Berg, Ja
Characterization of nanowires of semiconducting metal-oxides and their functional properties 1-gen-2007 Baratto C; Bianchi S; Comini E; Faglia G; Ferroni M; Ortolani L; Merli PG; Morandi V; Todros S; Vomiero A; Sberveglieri G
Contrast and resolution versus specimen thickness in low energy scanning transmission electron microscopy 1-gen-2007 Morandi, V; Merli, Pg
Electrical and holographic characterization of gold catalyzed titania-based layers 1-gen-2007 Ortolani, L; Comini, E; Fazzini, Pf; Ferroni, M; Guidi, V; Merli, Pg; Morandi, V; Pozzi, G; Sberveglieri, G; Vomiero, A
Scanning electron microscopy of thinned specimens: From multilayers to biological samples 1-gen-2007 Morandi, V; Merli, Pg; Quaglino, D
Si Ultra Shallow Junctions Dopant Profiling with ADF-STEM 1-gen-2007 Parisini, A; Giubertoni, D; Bersani, M; Morandi, V; Merli, Pg; van den Berg, Ja
Synthesis of small gold nanoparticles: Au(I) disproportionation catalyzed by a persulfurated coronene dentrimer 1-gen-2007 Bergamini, G; Ceroni, P; Balzani, V; Gingras, M; Raimundo, Jm; Morandi, V; Merli, Pg
Dopant regions imaging in scanning electron microscopy 1-gen-2006 Morandi, V; Merli, Pg; Ferroni, M
Electron Holography of Size- controlled Nanoclusters 1-gen-2006 Canton, P; Fazzini, Pf; Pozzi, G; Merli, Pg
Optimization of the performance of CVD diamond electron multipliers 1-gen-2006 Trucchi D.M. ; Scilletta C. ; Cappelli E. ; Merli P.G. ; Zoffoli S. ; Mattei G. ; Ascarelli P.
About the role of boundary conditions on compositional imaging with a scanning electron microscope 1-gen-2005 Merli, Pg; Morandi, V; Corticelli, F
Effects of beam-specimen interaction on the observation of reverse-biased p-n junctions by electron interferometry 1-gen-2005 Fazzini, Pf; Merli, Pg; Pozzi, G; Ubaldi, F
Effects of Ta/Nb-doping on titania-based thin films for gas-sensing 1-gen-2005 Comini, E; Ferroni, M; Guidi, V; Vomiero, A; Merli, Pg; Morandi, V; Sacerdoti, M; Della Mea, G; Sberveglieri, G
Interference Electron Microscopy of reverse biased p-n junction 1-gen-2005 Fazzini, Pf; Merli, Pg; Pozzi, G; Ubaldi, F
Low-energy STEM of multilayers and dopant profiles 1-gen-2005 Merli, Pg; Morandi, V
Scanning electron microscopy of dopant distribution in semiconductors 1-gen-2005 Merli, Pg; Morandi, V; Savini, G; Ferroni, M; Sberveglieri, G
The effects of boundary conditions on dopant region imaging in scanning electron microscopy 1-gen-2005 Ferroni M; Merli PG; Morandi V
Electron microscope calibration for the Lorentz mode 1-gen-2004 Fazzini, PF; Merli, PG; Pozzi, G
Investigation of dopant profiles in nanosized materials by scanning transmission electron microscopy 1-gen-2004 P. G. Merli; V. Morandi; A. Migliori; C. Baratto; E. Comini; G. Faglia; M.Ferroni; A. Ponzoni; N. Poli;G. Sberveglieri