CNR Institutional Research Information System

GAUCCI, PAOLO

GAUCCI, PAOLO  

Istituto di Nanotecnologia - NANOTEC  

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Risultati 1 - 20 di 23 (tempo di esecuzione: 0.05 secondi).
Titolo Data di pubblicazione Autore(i) File
Edge Effects in Self-Heating-Related Instabilities in p-Channel Polycrystalline-Silicon Thin-Film Transistors 1-gen-2011 Mariucci, L; Gaucci, P; Valletta, A; Pecora, A; Maiolo, L; Cuscunà, M; Fortunato, G
Analysis of Self-Heating-Related Instability in Self-Aligned p-Channel Polycrystalline-Silicon Thin-Film Transistors 1-gen-2010 Gaucci P.; Valletta A.; Mariucci L.; Pecora A.; Maiolo L.; Fortunato G.
Downscaling issues in polycrystalline silicon TFTs 1-gen-2010 Fortunato, G; Cuscunà, M; Gaucci, P; Maiolo, L; Mariucci, L; Pecora, A; Valletta, A
Downscaling issues in polycrystalline silicon TFTs 1-gen-2010 Fortunato G; Cuscunà M; Gaucci P; Maiolo L; Mariucci L; Pecora A; Valletta A
Self-Heating Related Instability in Polysilicon TFTs 1-gen-2010 Gaucci, P; Valletta, A; Cuscunà, M; Maiolo, L; Mariucci, L; Pecora, A; Fortunato, G
Threshold voltage in short channel polycrystalline silicon thin film transistors: Influence of drain induced barrier lowering and floating body effects 1-gen-2010 Valletta, A; Gaucci, P; Mariucci, L; Pecora, A; Cuscuna, M; Maiolo, L; Fortunato, G
Role of gate oxide thickness in controlling short channel effects in polycrystalline silicon thin film transistors 1-gen-2009 Valletta, A; Gaucci, P; Mariucci, L; Pecora, A; Cuscuna, M; Maiolo, L; Fortunato, G; Brotherton, Sd
Self-Heating Effects in p-Channel Polysilicon TFTs Fabricated on Different Substrates 1-gen-2009 Fortunato, G; Cuscuna, M; Gaucci, P; Maiolo, L; Mariucci, L; Pecora, A; Valletta, A; Templier, F
Drain induced barrier lowering and impact ionization effects in short channel polysilicon TFTs 1-gen-2008 Fortunato, G; Valletta, A; Gaucci, P; Mariucci, L; Cuscunà, M; Maiolo, L; Pecora, A
Hump characteristics and edge effects in polysilicon thin film transistors 1-gen-2008 Valletta, A; Gaucci, P; Mariucci, L; Fortunato, G; Templier, F
Negative bias-temperature stress in non-self-aligned p-channel polysilicon TFTs 1-gen-2008 Mariucci, L; Gaucci, P; Valletta, A; Cuscunà, M; Maiolo, L; Pecora, A; Fortunato, G
Role of field enhanced mechanisms and impact ionization on the threshold voltage of short channel polycrystalline silicon thin film transistors 1-gen-2008 Gaucci, P; Valletta, A; Mariucci, L; Pecora, A; Cuscunà, M; Maiolo, L; Fortunato, G
Self-heating effects in p-channel polysilicon TFTs fabricated on different substrates 1-gen-2008 Fortunato G.; M. Cuscunà; P. Gaucci; L. Maiolo; L. Mariucci; A. Pecora;A. Valletta; F. Templier
Sviluppo di elettronica su plastica 1-gen-2008 Guglielmo Fortunato; Stefano Cipolloni; Massimo Cuscunà; Paolo Gaucci; Luca Maiolo; Luigi Mariucci; Antonio Minotti; Alessandro Pecora; Matteo Rapisarda; Daniela Simeone; Antonio Valletta
Electrical Instabilities in P-channel Polysilicon TFTs: Role of Hot Carrier and Self-heating Effects 1-gen-2007 Fortunato, G; Gaucci, P; Mariucci, L; Pecora, A; Valletta, A
Electrical stability in self-aligned p-channel polysilicon Thin Film Transistors 1-gen-2007 Gaucci, P; Mariucci, L; Valletta, A; Pecora, A; Fortunato, G; Templier, F
Hot Carrier Effects in p-Channel Polycrystalline Silicon Thin Film Transistors Fabricated on Flexible Substrates 1-gen-2007 Mariucci, L; Gaucci, P; Valletta, A; Templier, F; Fortunato, G
Hot carrier effects in p-channel polysilicon thin film transistors 1-gen-2007 Gaucci P; Mariucci L; Valletta A; Cuscunà M; Maiolo L; Pecora A; Fortunato G; Templier F
Hump Characteristics and Edge Effects in Polysilicon Thin Film Transistors 1-gen-2007 Valletta, A; Gaucci, P; Mariucci, L; Fortunato, G; Templier, F
Modelling velocity saturation and kink effects in p-channel polysilicon thin-film transistors 1-gen-2007 Valletta A; Gaucci P; Mariucci L; Fortunato G;