CNR Institutional Research Information System

PARISINI, ANDREA

PARISINI, ANDREA  

Istituto per la Microelettronica e Microsistemi - IMM  

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Risultati 1 - 20 di 55 (tempo di esecuzione: 0.049 secondi).
Titolo Data di pubblicazione Autore(i) File
Comparison of Cliff-Lorimer-Based Methods of Scanning Transmission Electron Microscopy (STEM) Quantitative X-Ray Microanalysis for Application to Silicon Oxycarbides Thin Films 1-gen-2018 Parisini A.; Frabboni S.; Gazzadi G.C.; Rosa R.; Armigliato A.
SiGe layer thickness effect on the structural and optical properties of well-organized SiGe/SiO2 multilayers 1-gen-2017 Vieira, E M F; Toudert, J; Rolo, A G; Parisini, A; Leitao, J P; Correia, M R; Franco, N; Alves, E; Chahboun, A; Martinsanchez, J; Serna, R; Gomes, M J M
Size effect on high temperature variable range hopping in Al+ implanted 4H-SiC 1-gen-2017 Parisini, Antonella; Parisini, Andrea; Nipoti, Roberta
Dual emission in asymmetric "giant" PbS/CdS/CdS core/shell/shell quantum dots 1-gen-2016 Zhao, H; Sirigu, G; Parisini, A; Camellini, A; Nicotra, G; Rosei, F; Morandi, V; Zavelanirossi, M; Vomiero, A
Engineering interfacial structure in "Giant" PbS/CdS quantum dots for photoelectrochemical solar energy conversion 1-gen-2016 Jin, L; Sirigu, G; Tong, X; Camellini, A; Parisini, A; Nicotra, G; Spinella, C; Zhao, H; Sun, S; Morandi, V; Zavelanirossi, M; Rosei, F; Vomiero, A
Structural and functional characterizations of Al+ implanted 4H-SiC layers and Al+ implanted 4H-SiC p-n junctions after 1950°C post implantation annealing 1-gen-2016 Nipoti, Roberta; Parisini, Antonella; Sozzi, Giovanna; Puzzanghera, Maurizio; Puzzanghera, Maurizio; Parisini, Andrea; Carnera, Alberto
IBA study of SiGe/SiO2 nanostructured multilayers 1-gen-2014 Barradas, Nuno P.; Alves, E.; Vieira, E. M. F.; Parisini, A.; Conde, O.; MartinSanchez, J.; Rolo, A. G.; Chahboun, A.; Gomes, M. J. M.
Charge trapping properties and charge retention-time in amorphous SiGe/SiO2 nanolayers 1-gen-2013 F Vieira, E M; Diaz, R; Grisolia, J; Parisini, A; Martínsánchez, J; Levichev, S; G Rolo, A; Chahboun, A; M Gomes, M J
On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt-Si and its effect on the electrical properties 1-gen-2013 J.P.B. Silva; K.C. Sekhar; S.A.S. Rodrigues; M. Pereira; A. Parisini; E. Alves; N.P. Barradas; M.J.M. Gomes
On the formation of an interface amorphous layer in nanostructured ferroelectric Ba0.8Sr0.2TiO3 thin films integrated on Pt-Si and its effect on the electrical properties 1-gen-2013 Silva, J P B; Sekhar, K C; Rodrigues, S A S; Pereira, M; Parisini, A; Alves, E; Barradas, N P; Gomes, M J M
Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlattice 1-gen-2012 F Vieira, E M; Martínsánchez, J; G Rolo, A; Parisini, A; Buljan, M; Capan, I; Alves, E; P Barradas, N; Conde, O; Bernstorff, S; Chahboun, A; Levichev, S; M Gomes, M J
A Luminescent Host-Guest Hybrid between an EuIII Complex and MWCNTs 1-gen-2011 L. Maggini; J. Mohanraj; H. Traboulsi; A. Parisini; G. Accorsi; N. Armaroli;D. Bonifazi
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si 1-gen-2011 Mohacsi I; Petrik P; Fried M; Lohner T; van den Berg JA; Reading MA; Giubertoni D; Barozzi M; Parisini A
Electrical and structural properties of ultrathin SiON films on Si prepared by plasma nitridation 1-gen-2011 Hourdakis E; Nassiopoulou A G; Parisini A; Reading M A; van den Berg J A; Sygellou L; Ladas S; Petrik P; Nutsch A; Wolf M; Roeder G
High resolution medium energy ion scattering analysis for the quantitative depth profiling of ultrathin high-k layers 1-gen-2010 Reading MA; van den Berg JA; Zalm PC; Armour DG; Bailey P; Noakes TCQ; Parisini A; Conard T; De Gendt S
Cap removal and shortening of double-walled and very-thin multi-walled carbon nanotubes under mild oxidative conditions 1-gen-2009 Marega, R; Accorsi, G; Meneghetti, M; Parisini, A; Prato, M; Bonifazi, D
Cap removal and shortening of double-walled and very-thin multi-walled carbon nanotubes under mild oxidative conditions 1-gen-2009 Marega, Riccardo; Accorsi, Gianluca; Meneghetti, Moreno; Parisini, Andrea; Prato, Maurizio; Bonifazi, Davide; Bonifazi, Davide
Comparison of Electrical Measurements with Structural Analysis of Thin High-k Hf-Based Dielectric Films on Si 1-gen-2009 Hourdakis E.; Theodoropoulou M.; Nassiopoulou A. G.; Parisini A.; Reading M. A.; van den Berg J. A.; Conard T. ;Degendt S.
High Resolution Depth Profile Analysis of Ultra Thin High-º Hf Based Films Using MEIS Compared with XTEM, XRF, SE and XPS 1-gen-2009 van den Berg J. A.; Reading M A; Parisini A.; Kolbe M.; Beckhoff B.; Ladas S.; Fried M.; Petrik P.; Bailey P.; Noakes T.; Conard T. ;De Gendt S.
Thickness effects in tilted sample annular dark field scanning transmission electron microscopy 1-gen-2009 Parisini, A; Morandi, V; Mezzotero, S