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LUCIBELLO, ANDREA

LUCIBELLO, ANDREA  

Istituto per la Microelettronica e Microsistemi - IMM  

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Risultati 1 - 20 di 95 (tempo di esecuzione: 0.029 secondi).
Titolo Data di pubblicazione Autore(i) File
Fabrication of Ultra-Sharp Tips by Dynamic Chemical Etching Process for Scanning Near-Field Microwave Microscopy 1-gen-2023 Joseph, C. H.; Capoccia, Giovanni; Lucibello, Andrea; Proietti, Emanuela; Sardi, Giovanni Maria; Bartolucci, Giancarlo; Marcelli, Romolo
A microfluidic sensor in coplanar waveguide configuration for localized micrometric liquid spectroscopy in microwaves regime 1-gen-2018 Sardi, G M; Lucibello, A; Cursi, F; Proietti, E; Marcelli, R
Fabrication and test of RF MEMS in LTCC technology 1-gen-2018 Lucibello, Andrea; Marcelli, Romolo; Di Paola, Ernesto; Di Nardo, Sergio; Pochesci, Daniele; Croci, Renato; Germani, Chiara
Wafer-level micropackaging in thin film technology for RF MEMS applications 1-gen-2018 Persano, A; Siciliano, P; Quaranta, F; Taurino, A; Lucibello, A; Marcelli, R; Capoccia, G; Proietti, E; Bagolini, A; Iannacci, J
A coplanar waveguide microfluidic sensor for a micrometric local spectroscopy of liquid solutions 1-gen-2017 Lucibello, A; Sardi, G M; Proietti, E; Marcelli, R; Cursi, F
Cycling reliability of RF-MEMS switches with Gold-Platinum multilayers as contact material 1-gen-2017 Mulloni, Viviana; Margesin, Benno; Farinelli, Paola; Marcelli, Romolo; Lucibello, Andrea; De Angelis, Giorgio
Microwave broadband characterization of aging of SU-8 polymer as CPW substrate 1-gen-2017 Lucibello, A.; Sardi, G. M.; Proietti, E.; Marcelli, R.; Bartolucci, G.
Near-field microwave techniques for micro- and nano-scale characterization in materials science 1-gen-2017 Marcelli, R.; Lucibello, A.; Capoccia, G.; Proietti, E.; Sardi, G. M.; Joseph, C. H.; Michalas, L.; Bartolucci, G.; Kienberger, F.; Gramse, G.
Transmission microwave spectroscopy for local characterization of dielectric materials 1-gen-2017 Lucibello, A.; Joseph, C. H.; Proietti, E.; Sardi, G. M.; Capoccia, G.; Marcelli, R.
A broadband toolbox for scanning microwave microscopy transmission measurements 1-gen-2016 Lucibello, A.; Sardi, G. M.; Capoccia, G.; Proietti, E.; Marcelli, R.; Kasper, M.; Gramse, G.; Kienberger, F.
De-embedding techniques for nanoscale characterization of semiconductors by scanning microwave microscopy 1-gen-2016 Michalas, L.; Brinciotti, E.; Lucibello, A.; Gramse, G.; Joseph, C. H.; Kienberger, F.; Proietti, E.; Marcelli, R.
Influence of design and fabrication on RF performance of capacitive RF MEMS switches 1-gen-2016 Persano A.; Quaranta F.; Capoccia G.; Proietti E.; Lucibello A.; Marcelli R.; Bagolini A.; Iannacci J.; Taurino A.; Siciliano P.
Narrow-band filtering by means of triangular meta-material resonators based on RF MEMS cantilevers in CPW configuration 1-gen-2016 Lucibello, A; Proietti, E; Marcelli, R; Sardi, G M; Bartolucci, G
Scanning microwave microscopy technique for nanoscale characterization of magnetic materials 1-gen-2016 Joseph, C. H.; Sardi, G. M.; Tuca, S. S.; Gramse, G.; Lucibello, A.; Proietti, E.; Kienberger, F.; Marcelli, R.
The image phase approach for the design of RF MEMS shunt switches 1-gen-2016 Bartolucci, Giancarlo; De Angelis, Giorgio; Lucibello, Andrea; Marcelli, Romolo; Proietti, Emanuela
Wafer-level thin film micropackaging for RF MEMS applications 1-gen-2016 Persano, A; Siciliano, P; Quaranta, F; Lucibello, A; Marcelli, R; Capoccia, G; Proietti, E; Bagolini, A; Iannacci, J
Analytical evaluation of the capacitance of a conical sensor for micro-nano imaging techniques 1-gen-2015 Bartolucci, G; Sardi, G M; Marcelli, R; Proietti, E; Lucibello, A; Stoja, E; Frezza, F
Analytical evaluation of the capacitance of a conical sensor for micro-nano imaging techniques 1-gen-2015 Bartolucci, G; Sardi, Gm; Marcelli, R; Proietti, E; Lucibello, A; Stoja, E; Frezza, F
Modeling of a metallic truncated cone for electromagnetic capacitive sensors 1-gen-2015 Bartolucci, Giancarlo; Sardi, GIOVANNI MARIA; Marcelli, Romolo; Proietti, Emanuela; Lucibello, Andrea; Stoja, Endri; Frezza, Fabrizio
Nanoscale characterization of MOS systems by microwaves: Dopant profiling calibration 1-gen-2015 Michalas L.; Lucibello A.; Joseph C.H.; Brinciotti E.; Kienberger F.; Proietti E.; Marcelli R.