In this paper an analytical model for the steady-state temperature mapping of electronic devices and system boards is presented. The main assumptions are that the heat generation may by considered as two-dimensional and that the whole solid structure can be schematically modelled as a stack of several homogeneous layers of different materials and different sizes, also with various degree of asymmetry. The mathematical model is believed to replace conventional finite-element (FEM) thermal simulators for fast thermal mapping, accurate within 1% and able to run in interaction with electrical aand electro-themal automatic design tools. His convenience in terms of spees and calculation amounts is due to the fact that it requires 2-D meshing grids only at the interfaces instead of 3-D. The implemented thermal simulation program was validated by comparing the results of given virtual samples with the corresponding temperature and heat flux maps obtained with FEM analysis. The amount and the origin of the error percentage with respect to the FEM analysis were also investigated as a functions of the free input parameters of the analytical program.

Fast analytical thermal modeling of electronic devices and circuits with multi-layer stack mountings

Pasquinelli G
2003

Abstract

In this paper an analytical model for the steady-state temperature mapping of electronic devices and system boards is presented. The main assumptions are that the heat generation may by considered as two-dimensional and that the whole solid structure can be schematically modelled as a stack of several homogeneous layers of different materials and different sizes, also with various degree of asymmetry. The mathematical model is believed to replace conventional finite-element (FEM) thermal simulators for fast thermal mapping, accurate within 1% and able to run in interaction with electrical aand electro-themal automatic design tools. His convenience in terms of spees and calculation amounts is due to the fact that it requires 2-D meshing grids only at the interfaces instead of 3-D. The implemented thermal simulation program was validated by comparing the results of given virtual samples with the corresponding temperature and heat flux maps obtained with FEM analysis. The amount and the origin of the error percentage with respect to the FEM analysis were also investigated as a functions of the free input parameters of the analytical program.
2003
Istituto di Scienza e Tecnologie dell'Informazione "Alessandro Faedo" - ISTI
Circuits
Physical Sciences and Engineering
File in questo prodotto:
File Dimensione Formato  
prod_90960-doc_123449.pdf

solo utenti autorizzati

Descrizione: Fast analytical thermal modeling of electronic devices and circuits with multi-layer stack mountings
Tipologia: Versione Editoriale (PDF)
Dimensione 311.77 kB
Formato Adobe PDF
311.77 kB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/101781
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 2
  • ???jsp.display-item.citation.isi??? ND
social impact