Coherent diffractive imaging accomplished with short-wavelength probes, such as hard X-ray photons or medium-energy electrons, represents a powerful technique for disclosing the structure of nanoscale solids. The synergistic combination of coherent electron diffractive imaging (EDI) with conventional high resolution transmission electron microscopy (HRTEM) has led to improved resolution, allowing overcoming limitations intrinsic to both methodologies and increasing the sensitivity to fine structural features. Here, will be demonstrated that phase-retrieved electron diffractive HRTEM images of individual nanocrystals can be achieved with a resolution of 70 pm, while exposing the specimen to a low electron dose. Furthermore, in a EDI-HRTEM experiment, the detailed crystal structure of an oxide nanomaterial can be addressed by visualizing oxygen atomic columns at sub-Angstrom resolution without the need for any lens aberration corrector.

Resolving atoms at su-angstroem Resolution by coherent diffractive imaging in a transmission electron microscope

Carlino E
2009

Abstract

Coherent diffractive imaging accomplished with short-wavelength probes, such as hard X-ray photons or medium-energy electrons, represents a powerful technique for disclosing the structure of nanoscale solids. The synergistic combination of coherent electron diffractive imaging (EDI) with conventional high resolution transmission electron microscopy (HRTEM) has led to improved resolution, allowing overcoming limitations intrinsic to both methodologies and increasing the sensitivity to fine structural features. Here, will be demonstrated that phase-retrieved electron diffractive HRTEM images of individual nanocrystals can be achieved with a resolution of 70 pm, while exposing the specimen to a low electron dose. Furthermore, in a EDI-HRTEM experiment, the detailed crystal structure of an oxide nanomaterial can be addressed by visualizing oxygen atomic columns at sub-Angstrom resolution without the need for any lens aberration corrector.
2009
Istituto Officina dei Materiali - IOM -
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/11213
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