The director tilt angle distribution in vertically aligned nematic liquid crystal displays has been investigated by means of variable angle spectroscopic ellipsometry. Liquid crystal vertical alignment has been realized by thermal evaporation of SiO(x). By changing the deposition angle, it is possible to control the pretilt angle. The director profile inside the sample was inferred by reflection and transmission ellipsometric measurements. The tilt angle distribution inside the cell versus the applied voltage is reported and eventually, comparing it with the simulations from the elastic theory, the anchoring energy has been obtained.

Ellipsometric study of vertically aligned nematic liquid crystals

A Marino;V Tkachenko;G Abbate
2009

Abstract

The director tilt angle distribution in vertically aligned nematic liquid crystal displays has been investigated by means of variable angle spectroscopic ellipsometry. Liquid crystal vertical alignment has been realized by thermal evaporation of SiO(x). By changing the deposition angle, it is possible to control the pretilt angle. The director profile inside the sample was inferred by reflection and transmission ellipsometric measurements. The tilt angle distribution inside the cell versus the applied voltage is reported and eventually, comparing it with the simulations from the elastic theory, the anchoring energy has been obtained.
2009
Istituto Superconduttori, materiali innovativi e dispositivi - SPIN
ellipsometry
liquid crystal displays
nematic liquid crystals
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/11600
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