An experimental method for the determination of thermal nonlinearities of semiconductor doped glasses induced by cw laser radiation is presented. An estimation of the intensity dependent refractive index is given, at steady state conditions, which is in good agreement with experimental data reported in the literature for similar materials.

Interferometric technique for the determination of thermal nonlinearities in semiconductor glasses

S De Nicola;P Mormile;G Pierattini
1989

Abstract

An experimental method for the determination of thermal nonlinearities of semiconductor doped glasses induced by cw laser radiation is presented. An estimation of the intensity dependent refractive index is given, at steady state conditions, which is in good agreement with experimental data reported in the literature for similar materials.
1989
Istituto di Scienze Applicate e Sistemi Intelligenti "Eduardo Caianiello" - ISASI
semiconductor
interferometry
nanotechnology
optics
laser
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/118274
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