Pb1-xSnxTe single crystals have been grown by a vertical Bridgman method. They have typical Hall mobilities and carrier concentration values of 103 cm2/V · s and 1018 cm-3, respectively, and change from p- to n-type as the Sn content increases. The ingots were single crystal with a subgrain structure that has a misorientation no higher than 2?. The segregation of Sn has been determined and it suggests that there is a convective flow in the liquid.

Growth, morphological and structural characterization of Pb1-xSnxTe single crystals

BE Watts;
1991

Abstract

Pb1-xSnxTe single crystals have been grown by a vertical Bridgman method. They have typical Hall mobilities and carrier concentration values of 103 cm2/V · s and 1018 cm-3, respectively, and change from p- to n-type as the Sn content increases. The ingots were single crystal with a subgrain structure that has a misorientation no higher than 2?. The segregation of Sn has been determined and it suggests that there is a convective flow in the liquid.
1991
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/118868
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