The influence of static atomic displacements, due to atomic size effects in alloys with atoms having different covalent or ionic radii, on high angle annular dark field image contrast is studied quantitatively by simulations and experiments. We show that the static displacements can have a large influence on the Z contrast, depending on the alloy composition and on the scanning transmission electron microscopy specimen thickness. This influence has to be taken into account for quantitative chemistry measurement based on Z-contrast imaging.

Influence of the static atomic displacement on atomic resolution Z-contrast imaging

Grillo V;Carlino E;
2008

Abstract

The influence of static atomic displacements, due to atomic size effects in alloys with atoms having different covalent or ionic radii, on high angle annular dark field image contrast is studied quantitatively by simulations and experiments. We show that the static displacements can have a large influence on the Z contrast, depending on the alloy composition and on the scanning transmission electron microscopy specimen thickness. This influence has to be taken into account for quantitative chemistry measurement based on Z-contrast imaging.
2008
INFM
Inglese
77
054103
6
http://prb.aps.org/abstract/PRB/v77/i5/e054103
Sì, ma tipo non specificato
DARK-FIELD IMAGES
ALLOYS
SCATTERING
STEM
SEMICONDUCTORS
3
info:eu-repo/semantics/article
262
Grillo, V; Carlino, E; Glas, F
01 Contributo su Rivista::01.01 Articolo in rivista
none
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/119967
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