We report a widely applicable and highly controlled approach, based on electron beam lithography (EBL), to interconnect single nano-objects, previously immobilized onto solid surfaces, and to investigate the transport properties at the level of single nanostructures. In particular, a three-step EBL-procedure was used for this purpose by patterning two planar contacts on the sides of an individual nano-object. To demonstrate this approach, we use two different kinds of active elements: a semiconductor nanocrystal (tetrapod) and a thin triangular gold nanoprism (NT). (c) 2007 Elsevier B.V. All rights reserved.

Interconnection of specific nano-objects by electron beam lithography - A controllable method

Della Torre A;Pompa PP;del Mercato LL;Krahne R;Maruccio G;Carbone L;Manna L;Rinaldi R;
2008

Abstract

We report a widely applicable and highly controlled approach, based on electron beam lithography (EBL), to interconnect single nano-objects, previously immobilized onto solid surfaces, and to investigate the transport properties at the level of single nanostructures. In particular, a three-step EBL-procedure was used for this purpose by patterning two planar contacts on the sides of an individual nano-object. To demonstrate this approach, we use two different kinds of active elements: a semiconductor nanocrystal (tetrapod) and a thin triangular gold nanoprism (NT). (c) 2007 Elsevier B.V. All rights reserved.
2008
Istituto di Nanotecnologia - NANOTEC
INFM
SINGLE
NANOCRYSTALS
TRANSISTOR
MICROSCOPY
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/120632
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