The emission spectrum measured on the reversed field pinch RFX is dominated by carbon and oxygen lines. Nickel lines are seldom observed even though a large magnetic field perturbation causes intense plasma-wall interaction. The line emissions from hydrogen-like and helium-like ions observed in RFX are simulated by a collisional-radiative impurity diffusion model. An impurity diffusion coefficient of the order of 10 m(2)/s and an inward convective velocity of 90 m/s have been used for an adequate simulation of the hydrogen-like to helium-like resonant line ratios. The model can be used to estimate the effective charge of the plasma; the on-axis values in 800 kA discharges are found to range between 1.5 and 2.2, with peaks higher than 3 in the presence of carbon blooms. It is found that charge exchange processes with thermal hydrogen neutral atoms must be considered to account for the high G ratio values measured for carbon (0.6 to 0.7).
Carbon and oxygen behaviour in the reversed field pinch RFX
Carraro L;Puiatti ME;Scarin P;Valisa M;
1996
Abstract
The emission spectrum measured on the reversed field pinch RFX is dominated by carbon and oxygen lines. Nickel lines are seldom observed even though a large magnetic field perturbation causes intense plasma-wall interaction. The line emissions from hydrogen-like and helium-like ions observed in RFX are simulated by a collisional-radiative impurity diffusion model. An impurity diffusion coefficient of the order of 10 m(2)/s and an inward convective velocity of 90 m/s have been used for an adequate simulation of the hydrogen-like to helium-like resonant line ratios. The model can be used to estimate the effective charge of the plasma; the on-axis values in 800 kA discharges are found to range between 1.5 and 2.2, with peaks higher than 3 in the presence of carbon blooms. It is found that charge exchange processes with thermal hydrogen neutral atoms must be considered to account for the high G ratio values measured for carbon (0.6 to 0.7).I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.