The properties of silicon films deposited on stainless steel surfaces held at 77 K, which is approximately the FTU (Frascati Tokamak Upgrade) wall temperature, have been investigated for the first time. Bad adherence and traces of peeling resulted, using the same experimental conditions foreseen for the machine: silane concentration in helium equal to 0.11-0.13, current density in the range 40-150 mA/m2. On the contrary, good results were obtained on substrates held at 273 K. This temperature represents a reasonable compromise for FTU operations.

SILICON DEPOSITION ON STAINLESS-STEEL SURFACES IN VIEW OF THE CONDITIONING OF FTU VACUUM CHAMBER

1994

Abstract

The properties of silicon films deposited on stainless steel surfaces held at 77 K, which is approximately the FTU (Frascati Tokamak Upgrade) wall temperature, have been investigated for the first time. Bad adherence and traces of peeling resulted, using the same experimental conditions foreseen for the machine: silane concentration in helium equal to 0.11-0.13, current density in the range 40-150 mA/m2. On the contrary, good results were obtained on substrates held at 273 K. This temperature represents a reasonable compromise for FTU operations.
1994
Istituto di Nanotecnologia - NANOTEC
Silicon films
Stainless steel
Tokamak devices
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/121990
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