Zn3P2 precipitates are identified by SAD in dislocation-free LEC InP heavily doped to the saturation hole density of 3.0-10(18) cm(-3) by adding 1.10(19) Zn at/cm(3). The calculated density of Zn atoms forming the precipitates shows that precipitation is not the sole mechanism responsible for the saturation of the hole density. The features of the transition from dislocation-free to dislocated crystal observed by slightly decreasing the doping level are related to the LEC growth conditions.

Zn3P2 precipitates in dislocation-free LEC InP heavily doped with Zn

1995

Abstract

Zn3P2 precipitates are identified by SAD in dislocation-free LEC InP heavily doped to the saturation hole density of 3.0-10(18) cm(-3) by adding 1.10(19) Zn at/cm(3). The calculated density of Zn atoms forming the precipitates shows that precipitation is not the sole mechanism responsible for the saturation of the hole density. The features of the transition from dislocation-free to dislocated crystal observed by slightly decreasing the doping level are related to the LEC growth conditions.
1995
Istituto dei Materiali per l'Elettronica ed il Magnetismo - IMEM
Inglese
Cullis, AG; StatonBevan, AE
Microscopy of Semiconducting Materials 1995
Institute-of-Physics Conference on Microscopy of Semiconducting Materials 1995
423
426
0-7503-0347-6
IOP Publishing Ltd.
Bristol BS1 6BE
REGNO UNITO DI GRAN BRETAGNA
Sì, ma tipo non specificato
20-23 March 1995
Oxford (UK)
InP
precipitates
TEM electron diffraction
5
none
C Frigeri a, ; R Fornari a, ; JL Weyher, A; GM Guadalupi, B; F Longo a,
273
info:eu-repo/semantics/conferenceObject
04 Contributo in convegno::04.01 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.14243/123430
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