The electrodeposition of thick gold layers plays an important role both in traditional and high-tech productions, such as jewelry and microelectronics, respectively. In this work a secondary ion mass spectrometric study will be presented on Au co-deposits with (sub-)micrometric ceramic powders, in order to harden gold. Mass spectra are used to identify the components deposited, providing evidence of the additives and/or eventual contaminants introduced during electrolysis. Furthermore, analysis of ion depth profiles and the intensity distribution of ionic species along the film were studied.
SIMS investigation of Au-based Composites
S Barison;C Piccirillo;M Fabrizio;
2001
Abstract
The electrodeposition of thick gold layers plays an important role both in traditional and high-tech productions, such as jewelry and microelectronics, respectively. In this work a secondary ion mass spectrometric study will be presented on Au co-deposits with (sub-)micrometric ceramic powders, in order to harden gold. Mass spectra are used to identify the components deposited, providing evidence of the additives and/or eventual contaminants introduced during electrolysis. Furthermore, analysis of ion depth profiles and the intensity distribution of ionic species along the film were studied.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
