Ultra-thin (< 20 nm) lead zirconate-titanate films with Zr/Ti ratio of 20/80 have been deposited on single crystal MgO substrates by sol-gel techniques. Atomic force microscopy reveals a smooth surface consisting of pyramids or domes. The surface morphology is discussed in terms of a double-step growth process: epitaxial growth in the early stages followed by growth on screw dislocations.
Morphological and optical investigation of lead zirconate titanate (20/80) ultra-thin films
Watts BE;
2005
Abstract
Ultra-thin (< 20 nm) lead zirconate-titanate films with Zr/Ti ratio of 20/80 have been deposited on single crystal MgO substrates by sol-gel techniques. Atomic force microscopy reveals a smooth surface consisting of pyramids or domes. The surface morphology is discussed in terms of a double-step growth process: epitaxial growth in the early stages followed by growth on screw dislocations.File in questo prodotto:
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