An understanding of the growth mechanisms of ferroelectric lead zirconate titanate films is fundamental to the preparation of optimal devices. This work presents the results of X ray diffraction analysis and cross-section transmission electron microscopy obtained on Pb(Zr0.52Ti0.48)O3, and correlates them with electrical properties and preparation conditions. The particular preparation method chosen has demonstrated that the phase which tends to form below 550°C has the pyrochlore structure. Intermediate crystallisation of the film can result in discontinuities if the correct temperatures are not used and spurious phases form at the free surface.
The crystallisation behaviour of Pb(ZrTi)O3 sol--gel films on platinum electrodes
BE Watts;
1997
Abstract
An understanding of the growth mechanisms of ferroelectric lead zirconate titanate films is fundamental to the preparation of optimal devices. This work presents the results of X ray diffraction analysis and cross-section transmission electron microscopy obtained on Pb(Zr0.52Ti0.48)O3, and correlates them with electrical properties and preparation conditions. The particular preparation method chosen has demonstrated that the phase which tends to form below 550°C has the pyrochlore structure. Intermediate crystallisation of the film can result in discontinuities if the correct temperatures are not used and spurious phases form at the free surface.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
