Ge/Si and GexSi1-x heteroepitaxy is currently drawing a large scientific and technological attention due to its potential use in the design of new electrical and optoelettronical devices arising form the succesful integration of these syructures in the Si-based IC technology. Ge films grown on Si (100) (2x1) by UHV-CVD were analysed by means of AFM, XPS and RBS. The morphological variation obesrved in the samples deposited at different Ts in the range 325°C-450°C can be related to the variation of Ge mobility and H desorption rate governed by the substrate temperature.
XPS and AFM microstructural study on Ge/Si (100) (2x1) grown by UHV-CVD
G Padeletti;GM Ingo;
1996
Abstract
Ge/Si and GexSi1-x heteroepitaxy is currently drawing a large scientific and technological attention due to its potential use in the design of new electrical and optoelettronical devices arising form the succesful integration of these syructures in the Si-based IC technology. Ge films grown on Si (100) (2x1) by UHV-CVD were analysed by means of AFM, XPS and RBS. The morphological variation obesrved in the samples deposited at different Ts in the range 325°C-450°C can be related to the variation of Ge mobility and H desorption rate governed by the substrate temperature.File in questo prodotto:
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